Method for setting for sharing setting parameters between optical inspection apparatuses
A technology of optical inspection machine and setting method, which is applied in optical testing for flaws/defects, material analysis by optical means, measuring devices, etc., which can solve the problems of inability to maintain product quality, uniformity, time-consuming and inability to detect standards, etc.
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[0024] For fully understanding purpose of the present invention, feature and technical effect, hereby by following specific embodiment, in conjunction with accompanying drawing, the present invention is described in detail, as follows:
[0025] First please refer to figure 1 , which is a schematic diagram of an optical detection machine in an embodiment of the present invention. The optical inspection machine for various circuit board inspections includes: at least one light source device ( figure 1 Shown are the first light source device 111 and the second light source device 112 ), the image capturing device 120 , the computing host 130 and the carrying platform 140 . The carrying platform 140 is used to place the target object 200 to be measured, and the target object 200 to be measured generates light such as reflected light or scattered light correspondingly through the light irradiation of the first light source device 111 and the second light source device 112 And the...
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