Tire uniformity improvement through identification of measurement process harmonics using weibull regression

A technology of uniformity and Weibull distribution, applied in the field of tire uniformity, can solve problems such as unevenness of road wheels

Inactive Publication Date: 2017-05-31
MICHELIN & CO CIE GEN DES ESTAB MICHELIN
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

Process harmonic effects can be caused, for example, by the uniformity measurement machine itself due to non-uniformities in the road wheels used to load the tires during the uniformity measurement.

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  • Tire uniformity improvement through identification of measurement process harmonics using weibull regression
  • Tire uniformity improvement through identification of measurement process harmonics using weibull regression
  • Tire uniformity improvement through identification of measurement process harmonics using weibull regression

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Embodiment Construction

[0019] Reference will now be made in detail to embodiments, one or more examples of which are illustrated in the drawings. Each example is provided by way of explanation of the invention, not limitation of the invention. In fact, it will be apparent to those skilled in the art that various modifications and changes can be made in the embodiments without departing from the scope or spirit of the invention. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Accordingly, it is intended that aspects of the present invention cover such modifications and variations.

[0020] review

[0021] Example aspects of the invention are directed to methods and systems for improving tire uniformity. Rather, multiple uniformity measurements may be analyzed to identify contributions to uniformity measurements resulting from measurement process harmonics. The measurement process harmonics may be p...

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Abstract

Methods and systems for improving the uniformity of a tire are provided. More particularly, a magnitude of a uniformity parameter can be obtained for each tire in a set of a plurality of tires. The magnitudes associated with the set of tires can be transformed according to a probability distribution function (e.g. a Weibull distribution function) to obtain a set of transformed magnitudes. Parameters associated with a probability distribution function can be estimated based at least in part on the transformed magnitudes. Parameters associated with the probability distribution function can be used to determine data indicative of a measurement error in the uniformity measurements attributable to a measurement process harmonic. The data indicative of the measurement error can be used to correct uniformity measurements obtained for tires and to modify tire manufacture based at least in part on the corrected measurements.

Description

technical field [0001] The present invention relates to tire uniformity, and more particularly to improving tire uniformity by using Weibull regression to identify measurement errors caused by one or more harmonics of the measurement process. Background technique [0002] Among certain quantifiable properties of a tire, tire non-uniformity is related to symmetry (or lack thereof) with respect to the tire's axis of rotation. Unfortunately, conventional tire building methods have a high chance of producing tire unevenness. During tire rotation, the inhomogeneities present in the tire structure generate periodically varying forces at the wheel axis. Tire non-uniformity is very important as these force variations are transmitted as significant vibrations to the vehicle and the vehicle occupants. These forces are transmitted through the vehicle's suspension and can be felt on the seats as well as on the vehicle's steering wheel, or as noise in the passenger compartment. The am...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M17/02
CPCB29D30/0061B29D2030/0066B29D2030/0635G01M17/02
Inventor W·D·马夫布伊
Owner MICHELIN & CO CIE GEN DES ESTAB MICHELIN
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