Test equipment and its power supply fixture

A technology of power supply and fixture, which is applied in the field of semiconductor laser chip testing, can solve the problem of difficult contact between the power supply fixture and the bare BAR, and achieve the effect of good test and good contact

Active Publication Date: 2020-05-08
SHENZHEN RAYBOW OPTOELECTRONICS +1
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The invention provides a power supply fixture, which can solve the technical problem that the power supply fixture and the bare BAR are difficult to fit and contact in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test equipment and its power supply fixture
  • Test equipment and its power supply fixture
  • Test equipment and its power supply fixture

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] see figure 2 and image 3 , figure 2 It is a schematic diagram of the three-dimensional structure of the electric fixture of the present invention, image 3 yes figure 2 The schematic diagram of the explosion structure of the electric fixture shown. In this embodiment, the electric fixture is used to inject a large current when testing the bare BAR without electrical isolation of the semiconductor laser, wherein the bare BAR refers to an unpackag...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A power supply fixture, used for injecting a large current when a non-electrically isolated bare BAR of a semiconductor laser is tested, comprises a probe clamp and multiple elastic probes (101). The probe clamp grips and fixes the multiple elastic probes (101), and tips of the multiple elastic probes (101) are located on a same plane. A test device. The tips of the elastic probes (101) of the power supply fixture are located on the same plane, and are in good contact with the non-electrically isolated bare BAR, thereby facilitating the test of the non-electrically isolated bare BAR.

Description

technical field [0001] The invention relates to the technical field of semiconductor laser chip testing, in particular to a testing device and a power supply fixture thereof. Background technique [0002] With the application of semiconductor lasers (LD, Laser Diode) such as LD pumped solid-state lasers (DPL, Diode-Pumped Solid-State Laser), pump sources of various fiber lasers, laser cutting, welding, medical and laser military applications, etc. Increasingly, the requirements for the output power and reliability of semiconductor lasers are also increasing. The semiconductor laser chip is the core part of the semiconductor laser, known as the "CPU" of the semiconductor laser. [0003] Full bar is a high-power semiconductor laser chip without electrical isolation. Testing and characterization of the performance parameters (such as LIV characteristics, spectral characteristics, etc.) The key to chip structure design and perfect chip production process is also an important b...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & AuthorityPatents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2863G01R31/2865
Inventor胡海李国泉王泰山李成鹏刘文斌方继林
OwnerSHENZHEN RAYBOW OPTOELECTRONICS