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A multi-laser cooperative scanning method

A multi-laser and laser source technology, applied in the field of laser scanning, can solve problems such as the limitation of system capture time performance improvement, and achieve the effects of good capture probability performance, high work efficiency, and high capture probability

Active Publication Date: 2019-08-20
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] Aiming at the above-mentioned shortcomings in the prior art, a multi-laser cooperative scanning method provided by the present invention solves the problem of the limitation of system capture time performance improvement in the single-point scanning mode

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  • A multi-laser cooperative scanning method
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  • A multi-laser cooperative scanning method

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Embodiment Construction

[0038] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0039] Such as figure 1 As shown, the method for multi-laser cooperative scanning comprises the following steps:

[0040] S1. Set n laser sources respectively at the vertices of a regular n-gon with a side length of r, and set a laser source at the center of the regular n-gon;

[0041] S2. Make the laser source positioned at the center of the regular n-gon perform omni-directional scanning of the n-gon; make the laser sour...

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Abstract

The invention discloses a multi-laser cooperative scanning method, which includes the following steps: S1. Set n laser sources respectively at the apex positions of a regular n-gon with side length r, and at the center of the regular n-gon A laser source is set at place; S2, make the laser source that is positioned at the center position of regular n-gon carry out all-round rotation n-gon scanning; Perform continuous scanning in the area; S3, judge and end the scanning of the laser source at the center position; judge whether the laser source has scanned the target according to the light intensity value detected by the receiving end and end the scanning. The invention uses one laser source to scan the inner area of ​​the regular n-gon, and uses n laser sources to perform cooperative scanning on the periphery of the regular n-gon, so as to ensure that no dead angle is left in the scan, and at the same time ensure a high capture probability, and solve the single-point scanning method The limitation of system capture time performance improvement makes the system have higher work efficiency.

Description

technical field [0001] The invention relates to the field of laser scanning, in particular to a multi-laser cooperative scanning method. Background technique [0002] There are six existing laser scanning methods: the first one is Lissajous scanning, the scanning curve is a sinusoidal function with delay in time domain and frequency domain, the disadvantage of this method is that there is a missing scanning area, and it is difficult to implement; The second is progressive linear scanning, which is a way for the laser to scan line by line in sequence. The disadvantage of this method is that the scanning time is long and the efficiency is not high; the third is rose scanning, which uses sinusoidal scanning. The trajectory of the AM signal generated based on the wave is generated according to the rose equation. The general rose equation is an eight-petal rose. The central processing unit has a heavy burden; the fourth type of involute helical scanning, which is formed by the l...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V8/10
Inventor 杨帆何青兰
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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