Electronic device testing system and method

A technology of electronic equipment and testing methods, applied in the field of testing, can solve the problems of cumbersome testing process, manual recording, and spending a lot of manpower and time, and achieve the effect of saving testing labor costs and avoiding omissions and errors

Inactive Publication Date: 2019-01-04
HONG FU JIN PRECISION IND WUHAN CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] The reliability of product quality is the key to the successful sales of products. After the existing electronic equipment is produced, it needs to do a variety of reliability performance tests, and some reliability performance tests need to be repeated multiple times. The test process is cumbersome. And after each test is completed, testers need to manually record the test results, which in turn requires a lot of manpower and time to complete product testing

Method used

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  • Electronic device testing system and method
  • Electronic device testing system and method
  • Electronic device testing system and method

Examples

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Embodiment Construction

[0029] see Figure 1-4 In one embodiment, a test system 100 is used to test an electronic device 200 . The electronic device 200 may be a mobile phone, a tablet computer, a television, or the like. The testing system 100 includes a connection start module 10 , a picture acquisition module 20 and a comparison and judgment module 30 . The connection start module 10 is used for establishing a communication connection between the electronic device 200 and the test component 300 , and starts a test program of the test component 300 to test the electronic device 200 . The picture acquisition module 20 is used for acquiring the test result image of the electronic device 200 . The comparison and determination module 30 is configured to compare the test result image acquired by the picture acquisition module 20 with the pre-stored template image to acquire the test result.

[0030] In one embodiment, the image acquisition module 20 may start a camera (not shown) to capture the test ...

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Abstract

The invention discloses an electronic device testing system for testing the electronic device. The testing system comprises a connection startup module, a picture acquisition module and a comparison judgment module, wherein the connection startup module is used for enabling the electronic device and a testing assembly to be in communication connection and starting the testing program of the testing assembly to test the electronic device; the picture acquisition module is used for acquiring the testing result image of the electronic device; and the comparison judgment module is used for comparing the testing result image with a template image to acquire a testing result. The invention also provides an electronic device testing method. According to the electronic device testing system and the method disclosed in the invention, through acquiring the testing result image in the testing process and comparing the testing result image with the template image, the testing result can be automatically acquired, omissions and errors in artificial testing are avoided, and the manpower cost for testing can be saved.

Description

technical field [0001] The invention relates to the field of testing, in particular to a testing system and method for electronic equipment. Background technique [0002] The reliability of product quality is the key to the successful sale of the product. After the existing electronic equipment is produced, it needs to do a variety of reliability performance tests, and some reliability performance tests need to be repeated many times. The test process is cumbersome. And after each test is completed, the tester needs to manually record the test results, and then it takes a lot of manpower and time to complete the product test. SUMMARY OF THE INVENTION [0003] In view of this, it is necessary to provide a testing system and method for electronic equipment, which can save testing labor costs. [0004] An embodiment of the present invention provides a testing system for an electronic device, which is used to test the electronic device. The testing system includes: a connecti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 杨进维
Owner HONG FU JIN PRECISION IND WUHAN CO LTD
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