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A driving circuit, its working method, and a display device

A technology of driving circuits and working methods, applied in static indicators, instruments, etc., can solve problems such as abnormal display of display substrates, and achieve the effect of improving yield

Active Publication Date: 2021-09-21
BOE TECH GRP CO LTD +1
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  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a driving circuit, its working method, and a display device, which are used to solve the problem in the prior art that after the test signal line used for the lighting test is cut off, the remaining signal line leads are likely to cause abnormal display of the display substrate. question

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  • A driving circuit, its working method, and a display device
  • A driving circuit, its working method, and a display device
  • A driving circuit, its working method, and a display device

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Embodiment Construction

[0045] In order to further illustrate the driving circuit, its working method, and the display device provided by the embodiments of the present invention, a detailed description will be given below in conjunction with the accompanying drawings.

[0046] During the entire production process of the display device, it mainly includes the following two lighting forms:

[0047] The first one is lighting test; figure 1 As shown, when performing a lighting test, the signal line 10 in the display substrate is connected to the test signal line 12 through the signal line lead 11, and the test signal is transmitted to the signal line lead 11 by the detection module 13 through the test signal line 12, and then The test signal is further transmitted to the signal line 10 by the signal line lead 11, so as to realize the lighting of the display substrate. After the display substrate is lit, the display substrate can be tested by some existing means to determine its quality. Such as figur...

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Abstract

The invention discloses a driving circuit, its working method, and a display device, and relates to the field of display technology. In order to solve the problem in the prior art that after the test signal line used for the lighting test is cut off, the remaining signal line leads are likely to cause abnormal display of the display substrate. The problem. The drive circuit includes: a plurality of signal line leads corresponding to the signal lines in the display substrate; a short-circuit shielding circuit corresponding to the plurality of signal line leads, and the short-circuit shielding circuit is connected to the corresponding signal line lead and the corresponding Between the signal lines, it is used to conduct the connection between the corresponding signal line leads and the corresponding signal lines during the lighting test period, and disconnect the connection between the signal line leads and the corresponding signal lines during the module lighting period; The drive chips connected to the signal lines are used to provide corresponding drive signals for the multiple signal lines during the lighting period of the module. The drive circuit provided by the invention is used to control the display substrate to perform normal display.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a driving circuit, a working method thereof, and a display device. Background technique [0002] With the continuous development of display technology, there are more and more types of display devices. In order to improve the production yield of display devices, multiple inspections are performed on the display devices during the production process. Taking an active matrix organic light emitting diode (English: Active-matrix organic light emitting diode, AMOLED for short) display device as an example, when making an AMOLED display device, after cutting the AMOLED motherboard to obtain multiple independent display substrates, generally A lighting test (ET test) will be performed on the display substrate to confirm the quality of the display substrate. After confirming that the display substrate is in good condition, cut off the test signal line used for the lighting test in the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/3225G09G3/00
CPCG09G3/006G09G3/3225G09G3/3208G09G2300/0426G09G2320/0693G09G3/3258
Inventor 刘练彬梁恒镇兰传艳陆旭文慧王士豪
Owner BOE TECH GRP CO LTD
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