Device for testing insulation characteristics of low temperature insulation material based on conductive cooling
A technology of conduction cooling and low-temperature insulation, which is applied in the direction of test ship construction, test dielectric strength, etc.
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Embodiment 1
[0045] figure 2 It is a structural schematic diagram of a device for testing the insulation properties of insulating materials using disk-shaped electrodes according to an embodiment of the present invention. Such as figure 2 As shown, the device for testing the insulation properties of insulating materials using disk-structured electrodes includes: vacuum low temperature test chamber 1, molecular pump 2, refrigerator 3, cold head 4, insulating cooling guide 5, high voltage generator 6, high voltage lead wire 7 , High-voltage bushing 8, high-voltage electrode 9, grounding lead 10 and grounding electrode 11. Among them, the high-voltage electrode 9, the ground electrode 11 and the insulating cooling member 5 are located inside the vacuum low-temperature test chamber; the vacuum low-temperature test chamber 1 is evacuated by the molecular pump 2; the cold generated by the refrigerator 3 is passed through the cold head 4 to the ground electrode 11 for cooling; the high voltag...
Embodiment 2
[0049] In the embodiment of the present invention, only the structure of the high-voltage electrode and the ground electrode is different from that in Embodiment 1, and other components are the same.
[0050] Figure 4 It is a schematic diagram of a ring-shaped electrode according to an embodiment of the present invention. Such as Figure 4 As shown, the high-voltage electrode adopts a ring structure, the ground electrode adopts a rod or ring structure and is connected to an insulating cooling member (cooling mechanism), the high-voltage electrode is located outside the ground electrode, and the test sample is located between the high-voltage electrode and the ground electrode. The test sample is cooled by conduction of the ground electrode; the whole device is used to test the surface electrical characteristics, breakdown withstand voltage characteristics and surface flashover characteristics of sheet or film samples. There are one or more high-voltage electrodes. Specific...
Embodiment 3
[0052] In the embodiment of the present invention, only the structure of the high-voltage electrode and the ground electrode is different from that in Embodiment 1, and other components are the same.
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