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Information entropy multiplicative fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging

A technology of infrared thermal imaging and feature analysis, applied in the field of defect detection

Active Publication Date: 2019-10-29
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the traditional FCM algorithm cannot completely express the characteristics of each element, and many useful pixel features will be lost during the processing of defect information in different spaces and in different degrees. In order to solve this kind of problem, the present invention proposes a new objective function, including It not only improves the information of feature elements, but also handles the mutual interference between different degrees of defects.

Method used

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  • Information entropy multiplicative fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging
  • Information entropy multiplicative fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging
  • Information entropy multiplicative fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging

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Embodiment

[0065] figure 1 It is a flow chart of the method for analyzing and reconstructing the features of the information entropy multiplicative fuzzy defects based on infrared thermal imaging in the present invention.

[0066] In this example, if figure 1 As shown, a defect reconstruction and feature extraction method based on infrared thermal imaging of the present invention mainly includes three steps: S1, preprocessing of the video stream to be detected; S2, defect reconstruction; S3, feature extraction of the reconstructed image;

[0067] Below we combine the above three steps to describe in detail.

[0068] S1. Preprocessing of the video stream to be detected

[0069] S1.1, the video stream to be detected is represented by a matrix block as: Among them, N I ×N J represents spatial information, N T Represent time information;

[0070] S1.2, convert the matrix block into a two-dimensional matrix Y through the vector operator Vec();

[0071] Y=[Vec(Y(1)),Vec(Y(2)),…,Vec(Y(...

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Abstract

The invention discloses an information entropy multiplicative fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging, and the method comprises the steps: carrying out the extraction and feature analysis of defects of different spatial unevenness through a reconstruction model and an optimized fuzzy algorithm, and enabling the defect features of different spatialunevenness to be accurately divided; in the optimized fuzzy algorithm, constructing a new objective function, wherein one part comprises a product of sponsorship degree and hesitance degree, the feature information of the elements is enriched, and the other part comprises fuzzy entropy, the uncertainty of the feature information is described. Defects can be effectively distinguished by the aid ofthe method, the method is good in stability and high in efficiency due to the design and the structure, outstanding effects can be realized for characterization of defect feature textures and featurechromatic aberration, and the defects in different spaces and different degrees can be reasonably and accurately evaluated and analyzed.

Description

technical field [0001] The invention belongs to the technical field of defect detection, and more specifically relates to an information entropy multiplicative fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging. Background technique [0002] In recent years, infrared thermal imaging detection technology has developed rapidly. It does not damage the body, is fast and efficient, and can effectively solve the problems of traditional nondestructive testing methods such as high labor intensity, long cycle, low efficiency, and poor safety, and realize large-area rapid detection and save a lot of manpower and material resources. [0003] If there are defects on the surface of the test piece to be tested, it will affect its heat distribution. The test piece to be tested is heated to form a high-temperature zone and a low-temperature zone. Due to the difference in temperature, the heat in the high-temperature zone is transferred to the low-temp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/90
CPCG06T7/0008G06T7/90G06T2207/10016G06T2207/10048G06T2207/30164
Inventor 殷春张博程玉华黄雪刚张昊楠陈凯薛婷
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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