Analysis and Reconstruction Method of Exponential Entropy Additive Fuzzy Defect Feature Based on Infrared Thermal Imaging

A technology of infrared thermal imaging and feature analysis, applied in the field of defect detection

Active Publication Date: 2021-05-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the traditional FCM algorithm cannot completely express the characteristics of each element, and many useful pixel features will be lost during the processing of defect information in different spaces and in different degrees. In order to solve this kind of problem, the present invention proposes a new objective function, including It not only improves the information of feature elements, but also handles the mutual interference between different degrees of defects.

Method used

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  • Analysis and Reconstruction Method of Exponential Entropy Additive Fuzzy Defect Feature Based on Infrared Thermal Imaging
  • Analysis and Reconstruction Method of Exponential Entropy Additive Fuzzy Defect Feature Based on Infrared Thermal Imaging
  • Analysis and Reconstruction Method of Exponential Entropy Additive Fuzzy Defect Feature Based on Infrared Thermal Imaging

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Embodiment

[0067] figure 1 It is a flow chart of the present invention based on the exponential entropy additive fuzzy defect feature analysis and reconstruction method of infrared thermal imaging.

[0068] In this example, if figure 1 As shown, an exponential entropy additive fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging of the present invention mainly includes three steps: S1, preprocessing of the video stream to be detected; S2, defect reconstruction; S3, reconstructed image feature extraction;

[0069] Below we combine the above three steps to describe in detail.

[0070] S1. Preprocessing of the video stream to be detected

[0071] S1.1, the video stream to be detected is represented by a matrix block as: Among them, N I ×N J represents spatial information, N T Represent time information;

[0072] S1.2, convert the matrix block into a two-dimensional matrix Y through the vector operator Vec();

[0073] Y=[Vec(Y(1)),Vec(Y(2)),…,Ve...

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Abstract

The invention discloses an exponential entropy additive fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging. Through the reconstruction model and the optimized fuzzy algorithm, the defects of different degrees in different spaces are extracted and characterized, so that different degrees of defects in different spaces can be extracted and analyzed. The defect features can be accurately divided; at the same time, in the optimized fuzzy algorithm, a new objective function is constructed, one part includes the sum of approval and hesitation, which enriches the feature information of the element, and the other part contains exponential fuzzy entropy. The uncertainty of the feature information is described, the correlation of the damage area gain function is enhanced, the features are emphasized, and the defects are effectively distinguished. Such a design and structure have good stability and high efficiency. It plays a prominent role in the description of the characteristic texture of defects and the characterization of characteristic color differences, and can reasonably and accurately evaluate and analyze defects of different degrees in different spaces.

Description

technical field [0001] The invention belongs to the technical field of defect detection, and more specifically relates to an exponential entropy additive fuzzy defect feature analysis and reconstruction method based on infrared thermal imaging. Background technique [0002] In recent years, infrared thermal imaging detection technology has developed rapidly. It does not damage the body, is fast and efficient, and can effectively solve the problems of traditional nondestructive testing methods such as high labor intensity, long cycle, low efficiency, and poor safety, and realize large-area rapid detection and save a lot of manpower and material resources. [0003] If there are defects on the surface of the test piece to be tested, it will affect its heat distribution. The test piece to be tested is heated to form a high-temperature zone and a low-temperature zone. Due to the difference in temperature, the heat in the high-temperature zone is transferred to the low-temperatur...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N25/72G06T7/00G06T7/136
CPCG01N25/72G06T7/0004G06T2207/10016G06T2207/10048G06T7/136
Inventor 张博殷春程玉华薛婷黄雪刚陈凯张昊楠
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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