Height measurement method, height measurement equipment and storage medium

A technology of height measurement and measuring equipment, which is applied in the direction of measuring devices, instruments, and optical devices, etc., which can solve the problems of collision between measuring equipment and the measured object, poor universality of the height measurement scheme, and the measured object is easy to deviate from the measured range. , to achieve the effect of improving universality and height measurement efficiency

Active Publication Date: 2020-11-13
GOERTEK INC
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Problems solved by technology

However, in related measurement schemes, the measurement position of the measurement equipment is fixed, resulting in the measurement of small objects, the measured object is easy to deviate from the measured range
When measuring the height of a large object, it is easy to cause the collision between the measuring equipment and the measured object
This leads to poor universality of the height measurement scheme

Method used

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  • Height measurement method, height measurement equipment and storage medium
  • Height measurement method, height measurement equipment and storage medium
  • Height measurement method, height measurement equipment and storage medium

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Embodiment Construction

[0044] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0045] Because in many processing procedures, it is necessary to measure the height of the workpiece. However, in related measurement schemes, the measurement position of the measurement equipment is fixed, which leads to the fact that when measuring a small object, the measured object is likely to deviate from the measured range. However, when measuring the height of a larger object, it is easy to cause a collision between the measuring device and the object to be measured. This leads to poor universality of the height measurement scheme.

[0046] In order to solve the above-mentioned defects in the related art, an embodiment of the present invention proposes a height measurement method, the main solution of which includes the following steps:

[0047] Obtain the horizontal coordinates of the measuring point of the...

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Abstract

The invention discloses a height measurement method. The method comprises the following steps: obtaining horizontal coordinates of a measurement point of a measured object and a height range value ofthe measured object; determining the height drop amount of the distance measuring sensor according to the height range value; controlling the distance measuring sensor to move to the position corresponding to the horizontal coordinate of the measuring point in the horizontal plane, and controlling the height of the distance measuring sensor to be decreased by the height decreasing amount; and determining a height value corresponding to the measurement point according to the initial height of the distance measurement sensor, the height drop amount and the measurement value. The invention further discloses height measurement equipment and a computer readable storage medium, and the effect of improving the universality of the height measurement scheme is achieved.

Description

technical field [0001] The invention relates to the technical field of industrial measurement, in particular to a height measurement method, a measurement device and a computer-readable storage medium. Background technique [0002] With the improvement of production level, in the production process, the requirements for machining accuracy of the workpiece are also gradually increased. Therefore, in many machining processes, it is necessary to measure the height of the workpiece. However, in related measurement schemes, the measurement position of the measurement equipment is fixed, which leads to the fact that when measuring a small object, the measured object is likely to deviate from the measured range. However, when measuring the height of a larger object, it is easy to cause a collision between the measuring device and the object to be measured. This leads to poor universality of the height measurement scheme. [0003] The above content is only used to assist in under...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
CPCG01B11/0608
Inventor 王克学孔令营侯园园单秋云
Owner GOERTEK INC
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