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Test case generation method and system based on binary search iteration and electronic equipment

A test case generation and test case technology, applied in software testing/debugging, error detection/correction, electrical digital data processing, etc.

Active Publication Date: 2021-01-29
YANGTZE UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

After investigation, DRst is only used to assist some algorithms, and is not used to construct a new algorithm to solve ATCG-PC

Method used

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  • Test case generation method and system based on binary search iteration and electronic equipment
  • Test case generation method and system based on binary search iteration and electronic equipment
  • Test case generation method and system based on binary search iteration and electronic equipment

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Embodiment Construction

[0030] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0031] figure 1 A flow chart of a test case generation method based on binary search iteration provided by the embodiment of the present invention, as shown in figure 1 As shown, the method includes: a. performing static analysis on the program under test, extracting the target path set and static structure information of the program under test; b. based on the extracted static structure information, executing a binary search iterative algorithm to generate a new c. Drive the generated new test case to run the program under test, record and update the path coverage information; d. Determine whether the binary iterative algorithm has reached the algorithm termination condi...

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Abstract

The embodiment of the invention provides a test case generation method and system based on binary search iteration and electronic equipment. The method comprises the steps: carrying out the static analysis of a tested program, and extracting a target path set and static structure information; based on the extracted static structure information, executing a binary search iterative algorithm to generate a new test case; driving the tested program to run via the generated test case, and recording and updating path coverage information; selecting the test case with the optimal fitness from the test cases generated by the current iteration and the test cases reserved by the last iteration to carry out the next round of iteration til the iterative algorithm meets the termination condition. According to the binary search iterative algorithm provided by the embodiment of the invention, the potential relationship between the paths is fully utilized, and the test cases of other paths are quicklyfound by utilizing the existing test cases. The binary search has relatively high search efficiency, so that the test case generation efficiency for path coverage is improved, and the test cost is reduced.

Description

technical field [0001] The present invention relates to the field of software testing, more specifically, to a method, system and electronic equipment for generating test cases based on binary search iteration. Background technique [0002] Software testing is one of the important means to ensure software quality in the software development life cycle. Automated software testing (AST) is a promising method to improve the effectiveness and efficiency of software testing. A key factor affecting the efficiency of AST is to generate test cases that satisfy the selected coverage criteria, such as statement coverage, branch coverage, path coverage, etc. It is proved that the problem of statement or branch coverage can be transformed into the problem of path coverage. Therefore, finding a suitable path-coverage-oriented automated test case (ATCG-PC) method is an important topic in AST. [0003] So far, the research on ATCG-PC has achieved certain achievements, and several promine...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F8/65
CPCG06F11/3676G06F11/3684G06F11/3688G06F8/65
Inventor 胡中波蔡高成吴海涛杨先山熊凯俊
Owner YANGTZE UNIVERSITY
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