Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device for eliminating deformation interference of testing machine frame

A testing machine and frame technology, which is applied in the field of devices that eliminate the deformation interference of the testing machine frame, to achieve the effects of multi-functional real-time monitoring of the processing process of test pieces, convenient multi-functional testing, and convenient operation

Active Publication Date: 2021-02-05
YANSHAN UNIV
View PDF15 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide a kind of device for eliminating the deformation interference of the testing machine frame, to solve the problems in the prior art mentioned above, and eliminate the impact of the testing machine frame deformation on the measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device for eliminating deformation interference of testing machine frame
  • Device for eliminating deformation interference of testing machine frame
  • Device for eliminating deformation interference of testing machine frame

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0020] The object of the present invention is to provide a device for eliminating the deformation interference of the testing machine frame, so as to solve the above-mentioned problems in the prior art and eliminate the influence of the testing machine frame deformation on the measurement.

[0021] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device for eliminating a deformation interference of a testing machine frame. The device comprises a multifunctional support which comprises a first connecting plate, a second connecting plate and a plurality of vertical plates. The first connecting plate is fixedly disposed on an upper cross beam of the testing machine frame, and the second connecting plate is fixedly disposed on the testing machine frame at a testing machine workbench. The top end of each vertical plate is connected with the first connecting plate, the bottom end of each vertical plate is fixedly provided with a self-adjusting screw in sliding fit with the second connecting plate, and the self-adjusting screws are provided with two springs located on the two sides of the second connecting platerespectively. A vertical scale grating is fixedly arranged on one vertical plate, and a grating reading head used for reading scales on the scale grating is connected to a movable cross beam of the testing machine through a connecting frame. The device for eliminating the deformation interference of the testing machine frame is simple in structure and convenient to operate.

Description

technical field [0001] The invention relates to the technical field of metal detection equipment, in particular to a device for eliminating deformation interference of a testing machine frame. Background technique [0002] Material testing machine is one of the commonly used equipment for applying deformation to materials. In order to facilitate the installation and testing of unidirectional tension or compression specimens, the testing machine mostly adopts a wide two-column frame structure. The wide structure brings sufficient installation space, but It will also bring a certain nonlinear frame deformation problem, which will affect the loading accuracy of the test specimen. In addition, the servo motor is decelerated by a two-stage synchronous belt, and the ball screw is used to convert the rotation into the translational movement of the movable beam. Because both the synchronous belt and the ball screw have motion gaps, it is very difficult to precisely control the defo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/02G01N3/06
CPCG01N3/02G01N3/06G01N3/068G01N2203/0017G01N2203/0019G01N2203/0067G01N2203/0075G01N2203/0641G01N2203/0647
Inventor 张芳芳段永川刘煜乔海棣
Owner YANSHAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com