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Instrument for height measurement

A technology of height measurement and instrumentation, applied in height/level measurement, instruments, measuring devices, etc., can solve problems such as lack of surveying and mapping results, and achieve the effect of wide application range and accurate measurement results

Pending Publication Date: 2022-05-06
长沙湘匠智能科技有限公司
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AI Technical Summary

Problems solved by technology

[0002] In the field of engineering surveying and mapping, for common height measurement, level surveying instruments are used for height measurement. The measurement results are only relative to the ground, and do not have very accurate surveying and mapping results. The most accurate height measurement currently exists Using barometers and telemetry to measure and map heights also has certain errors. In order to change the traditional surveying and mapping methods and improve more accurate surveying and mapping standards, an instrument for height measurement is hereby designed.

Method used

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Embodiment Construction

[0035] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific implementation.

[0036]An instrument for height measurement, comprising a height correction mechanism 1, a horizontal correction chassis 2, and a laser correction mechanism 3, the height correction mechanism 1 is connected to the center of the top surface of the horizontal correction chassis 2, and the laser The correction mechanism 3 is arranged on the outer top section of the height correction mechanism 1, and the laser correction mechanism 3 can slide up and down on the outside of the height correction mechanism 1. The height correction mechanism 1 is composed of a water liquid correction tube 4, a top The tube cover 5, the correction frame 6, and the dismounted battery 7 are composed. The water liquid correction tube 4 is fixed on the top of the correction frame 6, and the disassembled battery 7 is connected to the bottom surface of the correcti...

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Abstract

The invention relates to an instrument for height measurement, which comprises a height measurement and correction mechanism, a horizontal correction chassis and a laser measurement and correction mechanism, the height measurement and correction mechanism is connected to the center of the top surface of the horizontal correction chassis, and the laser measurement and correction mechanism is arranged at the top section of the outer side of the height measurement and correction mechanism. And the laser alignment measuring mechanism can slide up and down on the outer side of the height alignment measuring mechanism. According to the invention, the design of a height measurement mode is optimized, a traditional measurement method is changed and improved into a method for measuring the height level by utilizing horizontal calibration and laser irradiation, the measurement result is more accurate, two sets of equipment can be adopted for synchronous measurement, the measurement is suitable for various buildings and field surveying and mapping, and the instrument has the functions of horizontal calibration, laser irradiation and the like. The device can be used as a gradienter, can also be used as an air pressure detection instrument, is more accurate in measurement result, is wider in application range, and is suitable for popularization and application.

Description

technical field [0001] The invention relates to the field of engineering measurement, in particular to an instrument for height measurement. Background technique [0002] In the field of engineering surveying and mapping, for common height measurement, level surveying instruments are used for height measurement. The measurement results are only relative to the ground, and do not have very accurate surveying and mapping results. The most accurate height measurement currently exists Using barometers and telemetry to measure and map heights also has certain errors. In order to change the traditional surveying and mapping methods and improve more accurate surveying and mapping standards, an instrument for height measurement is hereby designed. Contents of the invention [0003] The object of the present invention is to provide a kind of instrument that is used for altitude measurement, to solve above-mentioned technical problem, for realizing above-mentioned purpose the presen...

Claims

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Application Information

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IPC IPC(8): G01C5/00G01C5/06G01C9/00G01C9/18
CPCG01C5/00G01C5/06G01C9/00G01C9/18
Inventor 马文娟
Owner 长沙湘匠智能科技有限公司
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