Test method and device of storage chip, storage medium and electronic equipment

A technology for memory chips and testing methods, which is applied in the fields of memory chip testing, memory chip testing devices, computer-readable storage media and electronic equipment, and can solve the problems of low test efficiency of memory chips, so as to improve test efficiency and reduce charge The effect of sharing

Pending Publication Date: 2022-06-03
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present disclosure provides a memory chip testing method, a memory chip testing device, a computer-readable storage medium, and an electronic device, thereby improving at least to a certain extent the problem of low memory chip testing efficiency in the prior art

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  • Test method and device of storage chip, storage medium and electronic equipment
  • Test method and device of storage chip, storage medium and electronic equipment
  • Test method and device of storage chip, storage medium and electronic equipment

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Embodiment Construction

[0048] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be embodied in various forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0049] Exemplary embodiments of the present disclosure first provide a method for testing a memory chip, which can perform a read-write function test on the memory chip by writing and reading test data in a memory cell of the memory chip to be tested, and determine Memory chip test results. In this exemplary embodiment, the memory chip to be tested may be a DRAM (Dynamic Random Access Memory, dynamic random access memory).

[0050] figure...

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Abstract

The invention provides a test method and device of a storage chip, a storage medium and electronic equipment, and belongs to the technical field of semiconductors. The method comprises the following steps: writing test data into a storage unit of the to-be-tested storage chip; reading storage data from the storage unit; according to the test data and the storage data, generating a test result of the to-be-tested storage chip; wherein in the process of reading the storage data from the storage unit, the line gating pulse pre-charging time is less than the standard line gating pulse pre-charging time of the storage chip to be tested, and / or the current sensing delay time of the storage chip to be tested is less than the standard sensing delay time of the storage chip to be tested. The test efficiency of the memory chip can be improved.

Description

technical field [0001] The present disclosure relates to the field of semiconductor technology, and in particular, to a method for testing a memory chip, a device for testing a memory chip, a computer-readable storage medium, and an electronic device. Background technique [0002] Memory chips are widely used in various electronic products and are the main storage components. In order to test the performance of the memory chip, the manufacturer needs to test the read and write performance of the memory chip before it leaves the factory to check whether the memory chip is qualified. [0003] However, as the scale of memory chips increases, the time required to test memory chips becomes longer and longer, resulting in lower production efficiency and higher costs of memory chips. At the same time, with the continuous complexity of the internal structure of memory chips, how to The complete and comprehensive testing of memory chips has also become an urgent problem to be solved...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G11C29/08G11C29/12
CPCG11C29/1201G11C29/08G11C2029/1206G11C29/50012G11C29/36G06F3/0604G06F3/0653G06F3/0655G06F3/0673
Inventor刘东
OwnerCHANGXIN MEMORY TECH INC