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A multichannel testing method

A data testing, multi-channel technology, applied in the single-channel field

Inactive Publication Date: 2004-11-10
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to overcome the shortcoming that it is difficult to obtain all detailed data in a short time in the existing channel curve test technology, and to solve the contradiction between the test investment time and the comprehensive acquisition of test data existing in the prior art

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Experimental program
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Embodiment Construction

[0022] The implementation of the technical solution will be further described in detail below in conjunction with the accompanying drawings.

[0023] Such as figure 1 As shown, the hardware part is composed of the DUT, computer, related test instruments, and test record instruments.

[0024] Such as figure 2 As shown, the following are the processing steps of the main flow of the testing method of the present invention:

[0025] The first step, as shown in frame 21, according to relevant channel design information and the connection mode of computer parallel port line and channel to be tested when testing, provide any digital status (such as the i-th channel) of testing any channel (such as When the jth digital state), the computer parallel port needs to send the binary value (such as 00110011).

[0026] In the second step, as shown in box 22, an input data file is formed. Given multi-channel (such as 4 channels), under all possible digital states (such as each channel ha...

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Abstract

The invention relates to a multichannel data testing method, including the processing courses as follows: according to the performance parameters of a tested digital device, connecting computer parallel or serial interface to the controlled pins of relative device in need of input control one to one; collecting all the binary digital information to be transmitted by the computer parallel interface in all possible digital states of each channel, so as to form a data file controlling output information of computer parallel interface; inputting the data file and utilizing the parallel or serial interface to run relative computer number delivering software to deliver a number so as to set each state of the digital device; concurrently recording response parameter numerical value to be tested of each state of each channel. It overcomes the defect in incomplete data tested by routine sampling, adopts all possible digital states of multiple channels and synchronously utilizes computer parallel interface to complete setting and can concurrently record data at any time.

Description

technical field [0001] The invention relates to an efficient test method, in particular to the single-channel and multi-channel mass data test related to digital devices in the communication field. Background technique [0002] In the field of general communication, in the test and design related to digital devices, there will be a large amount of data required for testing to find out the response curve between the input signal and output signal of each channel to be tested. Especially the curve test of channels related to DAC (digital-to-analog converter) devices. Since the input signal is the permutation and combination of "0" and "1" signals related to multi-bit binary, the possible input signal situations are complex and various. Generally, the best test that people want is to spend as short a time as possible, and can thoroughly grasp the test data of the output response under all possible input signal conditions of this type of channel. [0003] The current testing m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H01L21/66H04B17/30
Inventor 谢瑞华李勇强田晓光
Owner ZTE CORP