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A multichannel testing method

A data test, multi-channel technology, applied in the field of single channel

Inactive Publication Date: 2007-04-25
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to overcome the shortcoming that it is difficult to obtain all detailed data in a short time in the existing channel curve test technology, and to solve the contradiction between the test investment time and the comprehensive acquisition of test data existing in the prior art

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Embodiment Construction

[0022] The following is a further detailed description of the implementation of the technical solution in conjunction with the accompanying drawings.

[0023] As shown in Figure 1, the hardware part is composed of the DUT, computer, related test instruments, and test recording instruments.

[0024] As shown in Figure 2, the following are the processing steps of the main flow of the test method of the present invention:

[0025] In the first step, as shown in box 21, according to the relevant channel design information and the connection mode of the computer parallel port line and the channel under test during the test, any digital state (such as the i-th channel) of any channel under test (such as The binary value (such as 00110011) that the computer parallel port needs to send when the j-th digital state).

[0026] In the second step, as shown in box 22, an input data file is formed. Given multi-channel (such as 4 channels), all possible digital states (such as each channel has 1...

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Abstract

The invention relates to a multichannel data testing method, including the processing courses as follows: according to the performance parameters of a tested digital device, connecting computer parallel or serial interface to the controlled pins of relative device in need of input control one to one; collecting all the binary digital information to be transmitted by the computer parallel interface in all possible digital states of each channel, so as to form a data file controlling output information of computer parallel interface; inputting the data file and utilizing the parallel or serial interface to run relative computer number delivering software to deliver a number so as to set each state of the digital device; concurrently recording response parameter numerical value to be tested of each state of each channel. It overcomes the defect in incomplete data tested by routine sampling, adopts all possible digital states of multiple channels and synchronously utilizes computer parallel interface to complete setting and can concurrently record data at any time.

Description

Technical field [0001] The invention relates to an efficient test method, in particular to the single-channel and multi-channel large data test related to digital devices in the communication field. Background technique [0002] In the general communication field, in the testing and design related to digital devices, there will be a large amount of data required for testing to find the response curve between the input signal and output signal of each channel under test. Especially the curve test of channels related to DAC (digital-to-analog converter) devices. Since the input signal is a combination of "0" and "1" signals related to multi-bit binary, the possible input signal situations are complicated and diverse. Generally, the best test that people hope is to spend as short a time as possible, and can thoroughly grasp the test data of the output response under all possible input signal conditions of this type of channel. [0003] The current test method is just a balance betwe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00G01R31/28H01L21/66H04B17/30
Inventor 谢瑞华李勇强田晓光
Owner ZTE CORP