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Error correction method for fringe projection profilometry system

a profilometry and fringe technology, applied in the field of three-dimensional reconstruction, to achieve the effect of enhancing the quality of the phase corresponding, reducing the influence of random noise, and simple process of implementation

Inactive Publication Date: 2019-09-05
SOUTHEAST UNIV
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  • Summary
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides a method to correct errors introduced during an FPP system measuring objects with low surface reflectance. The method uses a phase error correction algorithm based on the analysis of fringe modulation, which helps to improve the accuracy of three-dimensional reconstruction corresponding to dark texture. The algorithm has a simple implementation process and does not need to measure the same object many times, thus obviously enhancing the quality of a phase corresponding to an area with dark texture, and improving the accuracy of three-dimensional reconstruction corresponding to the dark texture.

Problems solved by technology

Technical Problem: An obvious phase error occurs when an FPP system measures an object with dark texture.

Method used

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  • Error correction method for fringe projection profilometry system
  • Error correction method for fringe projection profilometry system
  • Error correction method for fringe projection profilometry system

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Embodiment Construction

[0033]The present invention is further illustrated with reference to the accompanying drawings and specific embodiments. MATLAB is selected as the programming tool in the Windows operating system, to process sinusoidal fringe generated by a computer and a fringe image collected by a CCD camera. This embodiment uses a white plane with black texture as an object to be measured, to demonstrate the effectiveness of an error correction method provided by this invention. It should be understood that these embodiments are merely used to illustrate the present invention and are not intended to limit the scope of the present invention. Various equivalent modifications of the present invention made by those skilled in the art after reading the present invention, all fall within the scope defined by the appended claims of the present application.

[0034]The embodiment of the present invention discloses a method to correct errors introduced during an FPP system measuring a low-reflectance object....

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Abstract

The present invention discloses an error correction method for an FPP system. Implementation steps are as follows: first, collecting deformed fringes affected by an object using a camera; then, calculating the fringe modulation I″ by using the collected images, and normalizing the modulation; setting a segmentation threshold T, and for all pixels of which modulation I″<T, dividing them into several categories and pixels within each category having close I″ values; for all pixels in each category, acquiring multiple groups of N intensity values, and averaging these groups of intensity values to obtain a set of averaged intensity value curves; and finally, replacing the corresponding N intensity values of all the pixels in the category with the set of averaged intensity values, to complete image correction.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]This application is the national phase entry of International Application No. PCT / CN2017 / 075600, filed on Mar. 3, 2017, which is based upon and claims priority to Chinese Patent Application No. 201611159007.3 filed on Dec. 15, 2016, the entire contents of which are incorporated herein by reference.TECHNICAL FIELD[0002]The present invention relates to three-dimensional reconstruction in a computer vision, and more particularly, to an error correction method for fringe projection profilometry systems.BACKGROUND OF THE INVENTION[0003]Fringe projection profilometry (FPP), as a three-dimensional measurement technology based on fringe projection, has been widely studied and applied in recent years, because it has advantages of high accuracy and high speed, and is less sensitive to ambient light. The FPP also has limitations as a three-dimensional measurement method based on active light projection. The most obvious one of the limitations is tha...

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01B11/24G01B11/25
CPCG01B11/2504G01B11/2433G01B11/2527G06T7/50
Inventor DA, FEIPENGRAO, LI
Owner SOUTHEAST UNIV