The invention relates to the technical field of optical detection, in particular to an LED
chip defect detection method and
system, and the method comprises the following steps: obtaining an LED
chip wiring area pattern layer, positioning interval change pixel point pairs, dividing image blocks, constructing a crack trend through a path consistent with the extension direction, supplementing a wiring
boundary extension pattern layer, and obtaining an LED
chip wiring area pattern layer. And extracting an
electrode tail end brightness sequence, screening out disturbance lines, and concluding the disturbance lines as defect image areas according to a position range. According to the method, the crack trend is screened through the path extension direction, direction line segments are formed through communication, the coherence of structure extension information is enhanced, the wiring boundary is covered by a layer supplementing synchronous extension area, the discrimination precision of the spatial corresponding relation is enhanced, and the boundary brightness detection is combined with
mirror image contrast to remove interference. A symmetric disturbance area is reserved as a judgment basis, a path extension trend and a wiring area direction are spatially matched, a crack propagation path identification chain is constructed, and defect area tracking integrity and stability are improved.