Card control micro circuit breaker instrument

Abstract

The utility model discloses a card control micro circuit breaker instrument, which is characterized in that probes on a test panel are in binding positioning contact with metal wires and pins of a test screen, and current is released, so that micro circuit breaker metal wires of the test screen are burnt out, defective products are screened out, the yield is improved, and the cost loss is reduced.

Description

Technical Field

[0001] The utility model relates to the field of metal wiring micro-break of touch screens, in particular to a card-controlled micro-break instrument. Background Art

[0002] At present, touch screen products have a functional defect of micro-breakage of metal traces. Since the resistance of micro-breakage is very small compared with the resistance of ITO, for example, the resistance of ITO is 200Ω, the resistance of normal metal traces is 0.3Ω, and the resistance of micro-breakage metal traces is 3Ω. Therefore, the electrical test software cannot identify this defect, resulting in defect leakage. During the use of customers, due to repeated power-on, the metal traces in the micro-break area are slowly burned off, forming an open circuit, resulting in poor touch in this area, and customer complaints.

[0003] For example, the Chinese utility model patent (CN202121972353.X) discloses an automatic electrical testing machine. The utility model discloses that the utility model relates to the field of automated manufacturing technology, specifically to an automatic electrical testing machine, including a machine platform, on which an electrical testing mechanism, a feeding mechanism, an alignment mechanism, a defective product collection mechanism, a pressing mechanism and two material taking and placing mechanisms are arranged. The two material taking and placing mechanisms are arranged at both ends of the machine platform, respectively. The electrical testing mechanism is arranged in the middle of the machine platform, the alignment mechanism is arranged between the material taking and placing mechanism and the electrical testing mechanism at the front end, the defective product collection mechanism is arranged between the material taking and placing mechanism and the electrical testing mechanism at the rear end, the feeding mechanism is arranged beside the alignment mechanism and the electrical testing mechanism, and the pressing mechanism is arranged correspondingly to the electrical testing mechanism. During the detection process, the product can be pressed to prevent the position of the product from changing, which can avoid the product from moving during the electrical detection process and causing the detection to be out of place, which is beneficial to improving the detection accuracy, and the product trays can be automatically collected, sorted and stored, reducing manual operations, which is beneficial to reducing production costs.

[0004] However, the above-mentioned electrical test machine is still unable to properly identify the slight change in resistance at the micro-break of the metal wiring, which leads to the leakage of defective products. Utility Model Content

[0005] In order to solve the deficiencies of the above-mentioned prior art, the utility model provides a card-controlled micro-break instrument. The present application contacts the metal traces of the test screen and the pin binding position through the probe on the test panel, and releases current to burn out the micro-break metal traces of the test screen, thereby screening out defective products, thereby improving the yield and reducing cost losses.

[0006] The technical problem to be solved by the utility model is achieved by the following technical scheme: a card-controlled micro-break instrument is used to burn out the micro-break metal wiring of the test screen, the test screen includes a metal wiring and a pin binding position, the pin binding position is electrically connected to the metal wiring; the card-controlled micro-break instrument includes:

[0007] Electrical measuring instruments, and

[0008] A test panel, the test panel being electrically connected to the electrical test instrument;

[0009] The test panel includes a first probe area and a second probe area;

[0010] The first probe area is in contact with and connected to the pin binding position, and the second probe area is in contact with and connected to the metal trace;

[0011] Probes are respectively disposed on the surfaces of the first probe area and the second probe area for contacting the metal traces and pin binding positions of the test screen to release current.

[0012] As a preferred embodiment of the card-controlled micro-fracture instrument provided by the utility model, the probe includes a needle, a buffer spring and a base sleeve, the needle is embedded and slidably connected in the base sleeve, and a buffer spring for buffer support is provided at the bottom of the base sleeve.

[0013] As a preferred implementation of the card-controlled micro-fracture instrument provided by the utility model, the needle contact end is designed as a round head.

[0014] As a preferred implementation of the card-controlled micro-fracture instrument provided by the utility model, the elastic force of the buffer spring is 4-6g.

[0015] As a preferred implementation of the card-controlled micro-fracture instrument provided by the utility model, the probes are arranged in two parallel rows in the first probe area.

[0016] As a preferred implementation of the card-controlled micro-fracture instrument provided by the utility model, the probes are arranged in a U-shaped surround panel side in the second probe area.

[0017] As a preferred implementation of the card-controlled micro-fracture instrument provided by the utility model, the first probe area is arranged at the U-shaped bottom end of the second probe area.

[0018] As a preferred implementation of the card-controlled micro-break instrument provided by the utility model, the metal wiring width is 30um.

[0019] As a preferred implementation of the card-controlled micro-break instrument provided by the utility model, the micro-break area of ​​the metal wiring has a line width of 2-5um.

[0020] As a preferred implementation of the card-controlled micro-break instrument provided by the utility model, the electrical measuring instrument is electrically connected to the first probe area and the second probe area respectively through a signal transmission line.

[0021] The utility model has the following beneficial effects: a card-controlled micro-break instrument, used for burning out the micro-break metal traces of a test screen, the test screen comprising metal traces and pin binding positions, the pin binding positions being electrically connected to the metal traces; the card-controlled micro-break instrument comprising: an electric measuring instrument, and a test panel, the test panel being electrically connected to the electric measuring instrument; the test panel comprising a first probe area and a second probe area; the first probe area is in contact with and connected to the pin binding position, and the second probe area is in contact with and connected to the metal traces; probes are respectively provided on the surfaces of the first probe area and the second probe area for contacting the metal traces of the test screen and the pin binding position to release current. The present application contacts the metal traces of the test screen and the pin binding position with the probes on the test panel, and releases current to burn out the micro-break metal traces of the test screen, thereby screening out defective products, thereby improving the yield rate and reducing cost losses. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the scheme in the present application, a brief introduction is given below to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0023] Figure 1 A schematic diagram of the structure of the card-controlled micro-break instrument provided by the utility model;

[0024] Figure 2 A schematic diagram of the structure of the test screen of the card-controlled micro-break instrument provided by the utility model;

[0025] Figure 3 A schematic diagram of the structure of the test panel of the card-controlled micro-break instrument provided by the utility model;

[0026] Figure 4 A schematic diagram of the structure of the probe of the card-controlled micro-fracture instrument provided by the utility model;

[0027] Figure 5 This is a schematic diagram of the micro-breaking area structure of the card-controlled micro-breaking instrument provided by the utility model.

[0028] 1. Test screen; 11. Metal trace; 111. Micro-break area; 12. Pin binding position; 2. Electrical measuring instrument; 3. Test panel; 31. First probe area; 32. Second probe area; 4. Probe; 41. Base sleeve; 42. Buffer spring; 43. Needle. DETAILED DESCRIPTION

[0029] The present invention is described in detail below in conjunction with the accompanying drawings and embodiments, examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0030] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0031] In addition, the terms "first", "second", and "third" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first", "second", and "third" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0032] In the present invention, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix", "set" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. Example

[0033] like Figure 1 and Figure 2 As shown, the present application provides a card-controlled micro-break instrument, which is used to burn out a test screen 1 and micro-break a metal trace 11, wherein the test screen 1 comprises a metal trace 11 and a pin binding position 12, wherein the pin binding position 12 is electrically connected to the metal trace 11; the card-controlled micro-break instrument comprises:

[0034] Electrical measuring instruments 2, and

[0035] A test panel 3, wherein the test panel 3 is electrically connected to the electrical measuring instrument 2;

[0036] The test panel 3 includes a first probe area 31 and a second probe area 32;

[0037] The first probe area 31 is in contact with and connected to the pin binding position 12, and the second probe area 32 is in contact with and connected to the metal trace 11;

[0038] Probes 4 are respectively disposed on the surfaces of the first probe area 31 and the second probe area 32 for contacting the metal traces 11 and the pin binding positions 12 of the test screen 1 to release current.

[0039] The present application stacks a test panel 3 on the test screen 1, connects the first probe area 31 of the test panel 3 to the pin binding position 12 of the test screen 1, and connects the second probe area 32 to the metal trace 11 of the test screen 1. During electrical testing, the electrical measuring instrument 2 outputs a signal to the probe 4 of the second probe area 32, and uses the probe 4 to release current at the top of the metal trace 11 of the test screen 1. Finally, the current returns to the electrical measuring instrument 2 through the probe 4 of the first probe area 31 connected to the pin binding position 12. Each metal trace 11 forms a measurement circuit. The resistance of the micro-break area will increase relative to the normal area, and the heat generated by the current passing through the conductor is proportional to the current and resistance of the conductor, and also proportional to the power-on time. Finally, due to the increase in resistance and the rise in heat, the micro-break metal trace is burned out, making its resistance close to infinity, and then the resistance change of the micro-break metal trace is detected to screen out defective products, thereby improving the yield and reducing cost loss.

[0040] The electrical measuring instrument 2 is mainly composed of a measuring circuit, a control unit, a computer and other parts. The specific structure and operation of the electrical measuring instrument 2 are prior arts in this field and will not be elaborated in detail here.

[0041] In this embodiment, the pin binding position 12 includes a metal pin, preferably molybdenum-aluminum-molybdenum, to ensure good electrical connection and durability. This metal pin has good electrical conductivity and corrosion resistance. The molybdenum-aluminum-molybdenum pin also has good thermal conductivity and can effectively dissipate heat to ensure stable operation of components.

[0042] The metal wiring 11 includes an ITO electrode. The material of ITO is relatively hard. The current is released by point-to-point contact with the probe 4, which can ensure that the metal wiring 11 is not scratched.

[0043] Specifically, the test screen 1 may be, but is not limited to, a display screen or a touch screen. Example

[0044] like Figure 4As shown, in this embodiment, the probe 4 includes a needle 43, a buffer spring 42 and a base sleeve 41. The needle 43 is embedded and slidably clamped in the base sleeve 41. The bottom of the base sleeve 41 is provided with a buffer spring 42 for buffer support. The contact end of the needle 43 is designed as a round head, and the elastic force of the buffer spring 42 is 4-6g.

[0045] Through the above-mentioned structural design, the buffer spring 42 inside the probe 4 is selected to have a small elastic force, such as 4-6g. An elastic force above 6g may cause a risk of crushing the glass of the test product. At the same time, the needle tip at the end of the probe 4 is designed to be a round tip. By changing the end design of the probe 4 to a round tip, when the same pressure acts on the probe 4, the contact area is increased, thereby reducing the pressure at the contact position, thereby protecting the metal wiring from being scratched.

[0046] In another implementation of this embodiment, Figure 3 As shown, the probes 4 are arranged in two parallel rows in the first probe area 31 , and are arranged in a U-shape around the side of the panel in the second probe area 32 . Furthermore, the first probe area 31 is arranged at the bottom of the U-shape of the second probe area 32 .

[0047] The electrical measuring instrument 2 is electrically connected to the first probe area 31 and the second probe area 32 respectively through a signal transmission line. Example

[0048] In this application, if Figure 5 As shown, the metal wiring 11 has a line width of 30 um and a line width of a micro-break area 111 of the metal wiring 11 is 2-5 um.

[0049] Since the resistance of the micro-break area 111 changes very little relative to the resistance of ITO, and the electrical testing software cannot identify this defect, resulting in defect leakage. During the customer's use, due to multiple power-ons, the metal wiring in the micro-break area is slowly burned out, forming an open circuit, resulting in poor touch in this area and customer complaints.

[0050] In this embodiment, the metal trace 11 of the micro-break area 111 is contacted and connected through the probe 4 to form a measurement circuit. The resistance of the micro-break area 111 will increase relative to the normal area, and the heat generated by the current passing through the conductor is proportional to the current and resistance of the conductor, and also proportional to the power-on time. During the electrical test, the electrical measuring instrument 2 outputs a signal to the probe 4, and the probe is used to release the current at the top of the metal trace 11 of the test screen 1. Finally, the micro-break area 111 is burned out due to the increase in resistance and the increase in heat, thereby improving the yield and reducing cost losses.

[0051] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the embodiments of the utility model rather than to limit them. Although the embodiments of the utility model are described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the embodiments of the utility model can still be modified or replaced by equivalents, and these modifications or equivalent replacements cannot cause the modified technical solutions to deviate from the scope of the technical solutions of the embodiments of the utility model.

Claims

1. A card-controlled micro-break instrument, used for burning a test screen (1) to micro-break a metal trace (11), the test screen (1) comprising a metal trace (11) and a pin binding position (12), the pin binding position (12) being electrically connected to the metal trace (11); characterized in that: The card-controlled micro-break instrument comprises: Electrical measuring instruments (2), and A test panel (3), the test panel (3) being electrically connected to the electrical measuring instrument (2); The test panel (3) comprises a first probe area (31) and a second probe area (32); The first probe area (31) is in contact with and connected to the pin binding position (12), and the second probe area (32) is in contact with and connected to the metal wiring (11); Probes (4) are respectively provided on the surfaces of the first probe area (31) and the second probe area (32) for contacting the metal traces (11) and the pin binding positions (12) of the test screen (1) to release current.

2. The card-controlled micro-break instrument according to claim 1, characterized in that: The probe (4) comprises a needle (43), a buffer spring (42) and a base sleeve (41); the needle (43) is embedded and slidably engaged in the base sleeve (41); and the bottom of the base sleeve (41) is provided with a buffer spring (42) for buffer support.

3. The card-controlled micro-break instrument according to claim 2, characterized in that: The contact end of the needle (43) is designed to be round.

4. The card-controlled micro-break instrument as claimed in claim 2, characterized in that: The elastic force of the buffer spring (42) is 4-6g.

5. The card-controlled micro-break instrument according to claim 1, characterized in that: The probes (4) are arranged in two parallel rows in the first probe area (31).

6. The card-controlled micro-break instrument according to claim 1, characterized in that: The probes (4) are arranged in a U-shaped manner around the side of the panel in the second probe area (32).

7. The card-controlled micro-break instrument according to claim 5 or 6, characterized in that: The first probe area (31) is arranged at the U-shaped bottom end of the second probe area (32).

8. The card-controlled micro-break instrument according to claim 1, characterized in that: The metal wiring (11) has a line width of 30 um.

9. The card-controlled micro-break instrument according to claim 1, characterized in that: The micro-break area (111) of the metal wiring (11) has a line width of 2-5 um.

10. The card-controlled micro-break instrument according to claim 1, characterized in that: The electrical measuring instrument (2) is electrically connected to the first probe area (31) and the second probe area (32) respectively via signal transmission lines.

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