Infrared detector testing device

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By designing an infrared detector testing device that includes pulling out rocker and compression spring, the problem of easy bending and difficult operation of the infrared detector during the detection process is solved, and easy extraction and efficient testing are achieved.

CN222618806UActive Publication Date: 2025-03-14SUZHOU ZERO PERCEPTION TECH CO LTD

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Patent Information

Application Number: CN202421449099.9
Authority / Receiving Office: CN · China
Patent Type: Utility models(China)
Current Assignee / Owner
Filing Date: 2024-06-24
Publication Date: 2025-03-14
Estimated Expiration: 2034-06-24

AI Technical Summary

Technical Problem

The infrared detector needs to be plugged and unplugged repeatedly during the detection process, which makes the pins easy to bend. The operator needs to manually pull out the detector, resulting in high labor intensity, high cumulative defect rate and high operation difficulty.

Method used

An infrared detector testing device is designed, including a test platform, a test mechanism and a pull-out mechanism. The pull-out mechanism consists of a hinge seat and a pull-out rocker. By pressing the pressing part of the pull-out rocker, the infrared detector can be easily pulled out by using a compression spring and a lifting part to avoid deformation of the pins.

Benefits of technology

It realizes easy extraction of infrared detectors, avoids pin deformation, reduces the labor intensity of operators, improves testing efficiency, and reduces the risk of product defects.

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Figure CN222618806U_ABST

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Abstract

The utility model provides an infrared detector testing device, which comprises a testing platform, a testing mechanism and a pull-out mechanism, the testing mechanism comprises a testing bearing seat and a testing circuit board, the upper end face of the testing bearing seat is provided with a plurality of pin jacks arranged in an array, the pin jacks are internally provided with connectors electrically connected with the testing circuit board, and the pin jacks are connected with the testing circuit board. The pull-out mechanism comprises two groups of hinge seats symmetrically arranged on two sides of the test bearing seat and two pull-out seesaws hinged to the two groups of hinge seats respectively, and each pull-out seesaw comprises a hinge part hinged to the hinge seat, a tilting part close to one end of the test bearing seat and a pressing part far away from one end of the test bearing seat; compression springs are arranged between the lower ends of the pressing parts and the upper end of the test platform. When the pull-out mechanism is arranged for operation, the infrared detector can be easily pulled out only by pressing the two pull-out seesaws on the two sides of the test bearing seat at the same time, deformation of pins of the detector cannot be caused, the operation is simple and convenient, the labor intensity is reduced, and the test efficiency is greatly improved.

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Description

Technical Field

[0001] The utility model relates to the field of detector testing, in particular to an infrared detector testing device. Background Art

[0002] Infrared detectors are now widely used in vehicle assisted driving, optoelectronic pods, sights, detection and guidance and other fields.

[0003] Vehicle assisted driving, optoelectronic pods, detection and guidance and other application fields all require testing of complete detectors. During the detection process, infrared detectors need to be repeatedly plugged in and out for testing experiments to check their electrical properties, light sensing properties, etc. The probe part on the back of the infrared detector is a gold-plated and long pin with a large number of connecting pins, a small spacing between pins, and the pins themselves are easy to bend. During the test process, it is easy to cause the pins to bend. The bent infrared detector will be unusable and the pins need to be repaired. At the same time, the process of pulling out the infrared detector during the test is currently manually pulled out by the operator, in which the force application method and technique vary from person to person and the force application direction cannot be vertically upward. In the process of pulling out the photoelectric sensor, it is easy to cause the pins of the photoelectric sensor to bend, which is troublesome to repair. At the same time, the entire detector surface needs to be held and force needs to be applied during the manual plug-in process, which is easy to cause poor appearance and other conditions. The overall cumulative defective rate during the test process is high, and the operating space on the test device is limited, the manual plug-in operation is difficult, and the labor intensity is increased. Utility Model Content

[0004] In order to solve the problem in the prior art that infrared detectors need to be manually plugged in and out during testing, which may easily cause product defects and has high labor intensity, the utility model provides an infrared detector testing device that is convenient for pulling out the infrared detector.

[0005] The utility model provides an infrared detector testing device, comprising a testing platform, a testing mechanism arranged on the upper end of the testing platform, and a pulling-out mechanism arranged on the periphery of the testing mechanism, wherein the testing mechanism comprises a testing seat and a testing circuit board arranged below the testing seat, wherein the upper end surface of the testing seat is provided with a plurality of pin sockets arranged in an array, wherein the pin sockets are provided with connectors electrically connected to the testing circuit board, wherein the pulling-out mechanism comprises two groups of hinged seats symmetrically arranged on both sides of the testing seat and two pulling-out seesaws respectively hinged to the two groups of hinged seats, wherein the pulling-out seesaw comprises a hinged portion hinged on the hinged seat, a tilting portion close to one end of the testing seat, and a pressing portion away from one end of the testing seat, wherein a compression spring is provided between the lower end of the pressing portion and the upper end of the testing platform.

[0006] As a further improvement of the present invention, the test seat includes two seat plates arranged in parallel, each of the seat plates is provided with a plurality of pin sockets arranged in an array, a thermal conductive silicone pad is also provided between the two seat plates, and a thermal conductive platform fixedly connected to the test platform is provided at the lower end of the thermal conductive silicone pad.

[0007] As a further improvement of the present invention, each group of the hinged seats is provided with two seat bodies which are arranged opposite to each other, and the pull-out rocker is hinged between the two seat bodies through a hinge shaft.

[0008] As a further improvement of the present invention, the test platform includes a supporting shell and a fixing plate, the supporting shell is an H-shaped structure, the test circuit board is arranged between the supporting shell and the fixing plate, the supporting shell is provided with a fixing hole for fixing the test seat, and the fixing plate is connected to the supporting shell by bolts.

[0009] As a further improvement of the present invention, heat dissipation fins are provided on both sides of the support shell.

[0010] As a further improvement of the utility model, the infrared detector testing device also includes an aperture cover covering the testing mechanism and the extraction mechanism, the aperture cover is provided with a circular aperture hole, and the aperture cover is detachably connected to the supporting shell.

[0011] As a further improvement of the present invention, the heat conduction platform and the support shell are integrally formed.

[0012] As a further improvement of the utility model, one side of the aperture cover is connected to one side of the supporting shell through a hinge.

[0013] As a further improvement of the utility model, a first fixing hole is provided at the lower end of the pressing part, a second fixing hole is provided at the upper end of the test platform opposite to the first fixing hole, and both ends of the compression spring are respectively installed in the first fixing hole and the second fixing hole.

[0014] As a further improvement of the present invention, the side surface of the raised portion that is used to contact the infrared detector is a rounded structure.

[0015] The beneficial effect of the utility model is that when the pull-out mechanism is operated, the infrared detector can be easily pulled out by pressing the two pull-out rockers on both sides of the test seat at the same time, which will not cause deformation of the detector pins, and the operation is simple and convenient, which reduces labor intensity and greatly improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a structural schematic diagram of an infrared detector testing device of the utility model;

[0017] Figure 2 This is a partial exploded structural diagram of an infrared detector testing device of the utility model;

[0018] Figure 3 It is a partial structural schematic diagram of an infrared detector testing device of the utility model;

[0019] Figure 4 The utility model is a cross-sectional view of an infrared detector testing device.

[0020] Figure markings: 1-test platform; 2-test mechanism; 3-pull-out mechanism; 4-infrared detector; 5-aperture cover; 6-hinge; 7-thermal conductive silicone pad; 11-support shell; 12-fixing plate; 21-test support; 22-test circuit board; 31-hinge seat; 32-pull-out rocker; 321-pressing part; 322-lifting part; 33-compression spring; 34-hinge shaft. DETAILED DESCRIPTION

[0021] In the description of the present invention, it should be understood that if there are descriptions involving orientation, such as orientations or positional relationships indicated by up, down, front, back, left, and right, the orientation description may be based on the orientation or positional relationships shown in the drawings. This is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation on the present invention.

[0022] In the description of the utility model, if there is a description of quantity, "several" means one or more, "more" means more than two, "greater than", "less than", "exceed" etc. are understood to exclude the number itself, and "above", "below", "within" etc. are understood to include the number itself. If there is a description of first or second, it is only used to distinguish the technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0023] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0024] like Figures 1 to 4As shown, the utility model discloses a testing device for an infrared detector 4, comprising a testing platform 1, a testing mechanism 2 arranged at the upper end of the testing platform 1, and a pulling-out mechanism 3 arranged at the periphery of the testing mechanism 2, the testing mechanism 2 comprising a testing seat 21 and a testing circuit board 22 arranged below the testing seat 21, the upper end surface of the testing seat 21 is provided with a plurality of pin sockets arranged in an array, the pin sockets are provided with a connector electrically connected to the testing circuit board 22, the pulling-out mechanism 3 comprises two groups of hinged seats 31 symmetrically arranged on both sides of the testing seat 21 and two pulling-out rockers 32 respectively hinged to the two groups of hinged seats 31, the pulling-out rocker 32 comprises a hinged portion hinged on the hinged seat 31, a tilting portion 322 close to one end of the testing seat 21 and a pressing portion 321 away from one end of the testing seat 21, and a compression spring 33 is provided between the lower end of the pressing portion 321 and the upper end of the testing platform 1.

[0025] When testing, first, the pins of the infrared detector 4 to be tested are correspondingly inserted into the pin jacks on the test holder 21 and electrically connected to the test circuit board 22 through the connector, and then the external test system connected to the test circuit board 22 tests its detector. After the test is completed, the operator presses and pulls out the pressing portion 321 at one end of the seesaw 32. At this time, the compression spring 33 is compressed, and the tilting portion 322 at the other end of the seesaw 32 contacts the lower edge of the infrared detector 4. When the seesaw 32 is pulled out and rotated, the tilting portion 322 of the seesaw 32 will push the infrared detector 4 upward. After pushing out a certain distance, the pins of the infrared detector 4 are separated from the connector, and then the infrared detector 4 can be easily removed. After the infrared detector 4 is removed, the seesaw 32 is pulled out and returns to its initial state under the action of the compression spring 33, so that the next round of testing operation on the infrared detector 4 can be continued.

[0026] When the pull-out mechanism 3 of the utility model is operated, the infrared detector 4 can be easily pulled out by pressing the two pull-out rockers 32 on both sides of the test seat 21 at the same time, without causing deformation of the detector pins. The operation is simple and convenient, reducing labor intensity and greatly improving test efficiency.

[0027] In the utility model, the test seat 21 includes two seat plates arranged in parallel, each of the seat plates is provided with a plurality of pin sockets arranged in an array, and the pin sockets arranged thereon correspond one-to-one with the pins on the infrared detector 4. A thermally conductive silicone pad 7 is also provided between the two seat plates, and a thermally conductive platform fixedly connected to the test platform 1 is provided at the lower end of the thermally conductive silicone pad 7. By providing the thermally conductive silicone pad 7, the infrared detector 4 in the test state can be cooled and a buffer protection can also be provided.

[0028] In the present invention, each set of the hinged seats 31 is provided with two seat bodies arranged opposite to each other, and the pull-out seesaw plate 32 is hinged between the two seat bodies through a hinge shaft 34. The pull-out seesaw plate 32 can be ensured to rotate stably and is convenient to arrange.

[0029] In the utility model, the test platform 1 includes a supporting shell 11 and a fixing plate 12. The supporting shell 11 is an H-shaped structure. The test circuit board 22 is arranged between the supporting shell 11 and the fixing plate 12. The test circuit board 22 can be supported, fixed and effectively dissipated by the supporting shell 11. The supporting shell 11 is provided with a fixing hole for fixing the test seat 21, and the fixing plate 12 is connected to the supporting shell 11 by bolts.

[0030] In the present invention, heat dissipation fins are provided on both sides of the support shell 11. The support shell 11 is a metal shell with heat conduction function, which can effectively dissipate heat for the test circuit board 22 and the infrared detector 4. The heat dissipation effect is improved by providing heat dissipation fins.

[0031] In the utility model, the infrared detector 4 testing device also includes an aperture cover 5 covering the testing mechanism 2 and the extraction mechanism 3, and the aperture cover 5 is provided with a circular aperture hole. The aperture cover 5 is used for testing the infrared detector 4. The specific testing principle is the prior art and will not be elaborated here. The aperture cover 5 is detachably connected to the supporting shell 11, which can facilitate the disassembly and assembly of the infrared detector 4 for testing.

[0032] In the present invention, the heat-conducting platform and the supporting shell 11 are integrally formed, which has a better heat conduction effect and ensures effective heat dissipation of the infrared detector 4 .

[0033] In the utility model, one side of the aperture cover 5 is connected to one side of the support housing 11 through a hinge 6, and can be quickly opened and closed, making the operation more convenient and quick.

[0034] In the present invention, the lower end of the pressing portion 321 is provided with a first fixing hole, the upper end of the test platform 1 is provided with a second fixing hole arranged opposite to the first fixing hole, and both ends of the compression spring 33 are respectively installed in the first fixing hole and the second fixing hole.

[0035] In the present invention, the side surface of the raised portion 322 that is in contact with the infrared detector 4 is a rounded structure, so that when it contacts the infrared detector 4, it will not scratch it, avoiding affecting the appearance of the detector.

[0036] The utility model has a simple structure, can not only quickly separate the infrared detector 4 from the test holder 21, but also ensure that the pins of the infrared detector 4 will not be deformed, greatly reducing the labor intensity of operators and greatly improving the test efficiency.

[0037] The above contents are further detailed descriptions of the present invention in combination with specific preferred implementations, and the specific implementation of the present invention cannot be considered to be limited to these descriptions. For ordinary technicians in the technical field to which the present invention belongs, several simple deductions or substitutions can be made without departing from the concept of the present invention, which should be regarded as falling within the protection scope of the present invention.

Claims

1. An infrared detector testing device, characterized in that: The invention comprises a test platform, a test mechanism arranged at the upper end of the test platform and a pull-out mechanism arranged at the periphery of the test mechanism, the test mechanism comprises a test seat and a test circuit board arranged below the test seat, the upper end surface of the test seat is provided with a plurality of pin sockets arranged in an array, the pin sockets are provided with connectors electrically connected to the test circuit board, the pull-out mechanism comprises two groups of hinged seats symmetrically arranged on both sides of the test seat and two pull-out rockers respectively hinged to the two groups of hinged seats, the pull-out rocker comprises a hinged portion hinged on the hinged seat, a tilting portion close to one end of the test seat and a pressing portion away from one end of the test seat, and a compression spring is provided between the lower end of the pressing portion and the upper end of the test platform.

2. The infrared detector testing device according to claim 1, characterized in that: The test seat includes two seat plates arranged in parallel, each of which is provided with a plurality of pin sockets arranged in an array, and a thermal conductive silicone pad is provided between the two seat plates, and a thermal conductive platform fixedly connected to the test platform is provided at the lower end of the thermal conductive silicone pad.

3. The infrared detector testing device according to claim 1, characterized in that: Each group of the hinged seats is provided with two seat bodies which are arranged opposite to each other, and the pull-out rocker is hinged between the two seat bodies through a hinge shaft.

4. The infrared detector testing device according to claim 2, characterized in that: The test platform includes a supporting shell and a fixing plate. The supporting shell is an H-shaped structure. The test circuit board is arranged between the supporting shell and the fixing plate. The supporting shell is provided with fixing holes for fixing the test seat. The fixing plate is connected to the supporting shell by bolts.

5. The infrared detector testing device according to claim 4, characterized in that: Heat dissipation fins are arranged on both sides of the supporting shell.

6. The infrared detector testing device according to claim 4, characterized in that: The infrared detector testing device also includes an aperture cover covering the testing mechanism and the extraction mechanism, wherein the aperture cover is provided with a circular aperture hole, and the aperture cover is detachably connected to the supporting shell.

7. The infrared detector testing device according to claim 4, characterized in that: The heat-conducting platform and the supporting shell are integrally formed.

8. The infrared detector testing device according to claim 6, characterized in that: One side of the aperture cover is connected to one side of the supporting shell through a hinge.

9. The infrared detector testing device according to claim 1, characterized in that: A first fixing hole is disposed at the lower end of the pressing portion, a second fixing hole is disposed at the upper end of the test platform and is arranged opposite to the first fixing hole, and two ends of the compression spring are respectively installed in the first fixing hole and the second fixing hole.

10. The infrared detector testing device according to claim 1, characterized in that: The side surface of the raised portion that is in contact with the infrared detector is a rounded structure.