A variable-RC SPAD quench circuit uses delayed buffer control to fully quench avalanches while keeping dead time and recharge time short.
Delayed clock phases and parallel secondary latches balance rise and fall clock-to-Q delay, improving 50% duty-cycle clock outputs.
A multi-phase generator delays the dynamic logic clock so mixed static-dynamic stages receive data correctly after clock tree balancing.
Redundant serial and parallel transistor duplication hardens a DICE latch so data flips only under three or more simultaneous inversions.
Control signals let a TSPC flip-flop switch between normal toggling and set/reset loading, holding preset states without losing high-speed operation.
AGC-controlled current and opposing diode clamps help a low-power crystal oscillator recover quickly from EMI without added normal-operation power.
Current limiters such as diode-connected MOSFETs curb leakage between switches, enabling reliable sub-threshold voltage conversion.
Multiple slave latches and an output selector let one flip-flop support parallel data handling while reducing duplicated logic area.
Sharing clock transistors across tri-state inverter and latch stages reduces flip-flop area and power while maintaining correct operation.
Adaptive pulse counter read-out switching improves dead-time correction accuracy at high count rates while reducing power use.
A three-stage volatile and non-volatile storage scheme cuts power use while preserving circuit state for faster restart recovery.
A switched current-source and mirror scheme stabilizes Schmitt trigger thresholds across PVT variation while eliminating DC current.
A clamping and feedback circuit keeps the PMOS off and limits first-node leakage, improving level shifting across low and high supply voltages.
AC mains zero-crossings calibrate an LED driver’s internal timer, improving time accuracy without adding an external crystal.
Temporal SET filters and separated latch nodes harden a D flip-flop against radiation glitches without redundant circuits or major area penalty.
Simultaneous 33kHz and 66kHz signal injection improves buried cable and pipe locating accuracy without manual frequency selection.
Cross-coupled current compensation steers excess current from the timing capacitor to keep VCO gain linear across a wide tuning range and reduce PLL jitter.
Splitting resonator temperature drift correction into analog and digital paths cuts bit depth, phase noise, and power while keeping timing stable.
A separate correction module compensates metastability outside the Sigma-Delta feedback loop, preserving stability while improving SNR and dynamic range.
Uses differently sized BJTs to generate balanced 90-degree quadrature signals with lower power and less sensitivity to resistor variation.
Using one shared current source and one comparator, this oscillator cuts power and area while maintaining a stable 50% duty cycle.
Cross-coupled couplers boost transconductance in a differential Colpitts VCO, improving start-up while cutting bias current and phase noise.
Switching current-source and capacitor connections enables low-frequency RTC oscillation with smaller RC elements, less area, and better accuracy.
OAI and AOI clock logic remove transmission gates in scan flip-flops, cutting power use, circuit area, and design complexity.
Multiple delayed D flip-flops and a selector extend phase correction range while preserving metering precision in electric energy devices.
A switchable coupling module keeps hysteresis voltage independent of reference voltage, balancing noise tolerance, accuracy, and response speed.
An extended slave-counter transition keeps PWM frequency changes aligned, avoiding phase errors, duty-cycle drift, and circuit instability.
Resistor-coupled source nodes and staged inverters suppress power and ground noise, improving delayed clock signal integrity.
Preloaded bistable elements and compressible couplings tune passive mechanical signal transfer for small, tamper-resistant sensors.
Dynamic bias switching and temperature-compensated current generation stabilize RC oscillator frequency while cutting comparator power.
Alternating two integrators through a comparator and flip-flop cuts mismatch sensitivity, parasitic effects, and oscillator power use.
A higher-order LPF and switched-capacitor sampling remove PWM voltage ripple while allowing a smaller analog circuit area.
A programmable delay and phase-processing scheme generates varied n× clocks and precise 50% duty cycles with less hardware complexity.
A retention circuit in a TSPC flip-flop cuts clock power and area while preserving state across local power switching.
Using both clock edges, this ADC comparator cuts power and area while preserving dynamic range and robustness to process and temperature variation.
An adjusting branch precharges switch-transistor nodes to an intermediate level, cutting response time and improving CDR resolution.
A duty monitor and controller feedback loop correct write clock distortion in memory interfaces to improve data reception accuracy.
Discrete phase-shifted clocks and flip-flop output selection sharpen PWM edge timing, improving voltage regulation without delay lines or runtime calibration.
Cuttable trimming elements let a counter reset timing to match oscillator variation, improving accuracy without enlarging circuit area.
Resistive coupling in the slave inverters removes internal clock inversion, cutting redundant transitions, power use, and clock-to-output delay.
Skew-calibration and duty-cycle correction keep differential clock signals phase-aligned and near 50% duty cycle under PVT variation.
Compares internal clock time with external rewrite data and allowable error limits to block illegitimate updates in vehicle networks.
MSR latches use high-threshold retention paths and power-mode switching to preserve logic state during power-down with low leakage.
Leakage compensation stabilizes flip-flop node voltages, cutting power use and preserving correct data output without extra inverter overhead.
Delayed switching of comparator differential pairs suppresses transient glitches while preserving accurate hysteresis thresholds.
A scan-enable latch switches between flip-flop and latch modes to cut IC area and power while preserving scan test reliability.
Separate thin-oxide and thick-oxide current-mirror legs shift ultra-low inputs to higher voltages without exceeding transistor reliability limits.
Balances clock-phase power with selectively enabled flip-flops to suppress digital spurs that degrade analog signals in mixed-signal ICs.
Cross-coupled half-rate DFE paths and feedback shift registers ease feedback delay limits for higher-speed serial data equalization.
Interpolation with pseudorandom truncation improves sine-wave frequency resolution while reducing harmonic distortion, circuit area, and power.