A getter sheet secures itself within a vacuum package by deforming elastically between the base and cap.
Segmented ground plane and heat sink suppress waveguide modes in monolithic microwave integrated circuits.
Elongated bonded structures near package edges reduce solder wetting on copper posts facing the center.
Segmented transistors manage parasitic capacitance to widen the time window for accurate logic level determination.
A thermal interface material layer with low modulus of elasticity absorbs impact between semiconductor packages.
Plasma-treated polyurethane coatings provide reliable electrical insulation and enhanced heat dissipation on complex leadframe structures.
Mixed pitch wiring density substrates integrate heterogeneous components by using planarization to reduce height differences and simplify assembly.
Variable-thickness conductive guide structure along the semiconductor boundary region prevents dicing cracks and moisture ingress, safeguarding active circuits.
Sacrificial layer blocks barrier deposition on conductive features to enable selective growth on dielectric surfaces.
A compliant pin fin heat sink accommodates surface flatness differences through a flexible interfacial layer.
Inclined side surface on semiconductor die protective layer prevents cracking and contamination by ensuring strong adhesion over steep scribe lines.
A semiconductor e-fuse structure uses a dummy metal plug to alter temperature gradients and electrical driving forces for faster void formation.
A conductive micro via array forms vertical interconnects outside the semiconductor die footprint in fan-out wafer level chip scale packages.
Composite encapsulants with reactive diluents stabilize reconfigured wafers, resolving curing stability and warpage trade-offs.
A thermal barrier isolates semiconductor regions within an integrated circuit substrate to enable precise on-chip temperature regulation.
A power semiconductor module arrangement uses heat-conducting paste reinforced with whiskers to bridge thermal resistance between the substrate and heat sink.
Segmented solder joints with insulating walls reduce vertical thermal resistance while preventing bridging.
A conductive interconnect penetrates a core layer to directly contact a chip pad, replacing solder bumps and underfill materials.
Grooves on the package plate channel underfill and extract trapped air, preventing bubbles that degrade OLED reliability.
A semiconductor apparatus uses an insulator layer with opposite electric charge to create a depletion region at the silicon substrate interface.
Stacked dies on redistribution layers overcome spacing constraints of solder balls to achieve low-profile, high-density integrated packages.
Insulating plugs in metal gates serve as stop layers during chemical mechanical polishing to prevent gate dishing and enhance manufacturing yield.
A semiconductor chip with a thinner outer peripheral area guides sealing resin flow into the gap between chips.
A slidable thermal interface combines conductive and friction-reduction layers to transfer heat between substrates.
A semiconductor package structure uses a molding compound layer to encapsulate integrated circuit dies and conductive features without underfill materials.
Deflectable tie bars absorb molding force to protect the IC die while maintaining heatsink exposure.
Segmented cavities in a package-in-package mold isolate defects to maintain yield while increasing circuit quantity.
A tri-layer CoWoS package places IVR dies under CPU cores to minimize power delivery distance.
Thermocompression bonding sheet prevents dimples and adhesive residue on wafers during grinding.
A semiconductor encapsulating epoxy resin composition utilizes specific inorganic compounds to inhibit copper ion migration within the cured material.
A conductive layer embedded in an insulating substrate enables vertical and horizontal electrical interconnects for semiconductor devices.
Power reinforcement parts electrically couple the power distribution line edge to a surrounding guard ring.
Segmented surface grooves offset plate elongation to preserve flatness, ensuring reliable bonding and effective heat transfer.
A switchable heat sink uses a movable thermal transfer element to redirect heat flow between cooling stages.
An adhesive promoter layer on the substrate surface increases the gap between the IC die and the workpiece to enable proper underfill flow.
Integrating a multi-layer insulating structure directly onto the base plate prevents dendritic growth in corrosive environments.
Exposed leadframe legs bypass insulating molding compound to dissipate heat and reduce manufacturing costs.
Connecting terminals extend circumferentially outside a substrate to link components on opposite sides without through-holes.
A stacked integrated circuit cooling structure uses discrete connecting structures to form fluidic channels for directed coolant flow.
A molded package body features a step that exposes surface conductors on an area array substrate to support efficient chip stacking.
A multi-row wiring member integrates internal and external terminals within a planar resin layer to reduce device thickness.
Parallel metal layer traces in integrated circuits reduce power grid resistance, mitigating voltage drops that degrade signal integrity.
Segmented metal and solder bumps maintain substrate coplanarity during molding to prevent cracking from mold flow pressure.
Integrated metal bumps prevent solder resist misregistration and short circuits by merging connection structures with wiring layers.
A power module cooling device with thermally insulated surfaces manages heat dissipation across electrical equipment and electronic cards.
Segmented adhesive tapes prevent plating solution contact with metal layers, maintaining sealability and preventing dissipation.
Wafer-level encapsulation suspends devices within a frame to enable batch processing, preventing fluid leakage and reducing labor intensity.
A motion-detecting module uses a package cover with a transparent element to shield the light-sensing die.
Segmented storage layers and continuous reference layers in a magnetic memory device improve magnetic field distribution uniformity while reducing cell size.