3results about How to "Speed up reading" patented technology

The present application relates to a kind of optimization method and system of timing diagram subgraph matching.The method includes: time block is carried out to original timing diagram, and the edge with same end point is aggregated and compressed in each time block to generate intra-block multi-edge object, to build block index in turn;Query graph with time constraint is received, with the edge in query graph as matching unit to execute search, and maintain current legal time window;In candidate generation stage, according to current to be matched data vertex pair and current legal time window, construct cache key, and carry out exploration in hotspot cache;If hotspot cache is not hit, then use current legal time window to locate target time block, and execute intersection operation in target time block to generate candidate multi-edge list;When current to be matched data vertex pair meets preset hotspot condition, the candidate multi-edge list is written into hotspot cache;Continue to execute search based on the candidate multi-edge list of hit or generated candidate multi-edge list, until outputting model matching result.

This invention discloses a data classification method, apparatus, storage medium, and terminal for chip failure types. The method includes acquiring design information of the chip under test (DUT), and based on the design information, acquiring the DUT's size information, logical location-to-physical location correspondence information, and failure type information; acquiring test data of the DUT, and converting the test data into test physical location information based on the size information and logical location-to-physical location correspondence information; clustering the failure positions of the DUT using an optimized clustering algorithm based on the test physical location information to obtain failure clustering results; and classifying the failure positions of the DUT based on the failure type information and the failure clustering results to obtain failure classification results for the DUT. This method improves the efficiency of clustering operations by optimizing the clustering algorithm, saves memory occupied by the operation, and greatly improves the efficiency of chip failure type acquisition; it also improves data reading and saving efficiency and saves storage space.

The invention provides a molecular dynamics simulation atomic bonding state identification method and system based on a conditional random field, and the method comprises the steps: obtaining trajectory data generated through molecular dynamics simulation, and the trajectory data comprises atomic coordinates, atomic types and charge information which change with time; preprocessing the obtained trajectory data, screening a target atom set, and identifying potential bonding atom pairs frame by frame; based on the bonded atom pairs, extracting physical characteristics of the bonded atom pairs in each frame, including an inter-atomic Euclidean distance and a charge product; mapping the physical characteristics into a discrete observation state sequence; constructing a linear chain conditional random field model, and initializing model parameters to define conditional probability distribution between an observation state sequence and a hidden real keying state sequence; and inputting the observation state sequence into a linear chain conditional random field model, solving a hidden state sequence enabling the global probability to be maximum under conditional probability distribution by utilizing a Viterbi decoder, and obtaining an optimal keying state sequence of the atom pair changing along with time.