Direct contact type probe card

A technology of contact probes and probe cards, which is applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve the problems of reducing the incidence of defective phenomena, shortening the production time, etc., and achieve the effect of easy repair and prevention of bending phenomenon

Inactive Publication Date: 2009-12-09
UBPRECISION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] In order to solve the above-mentioned problems, the object of the present invention is to provide a direct contact probe card, respectively forming a needle block and an FPCB block formed with an FBCB contacted with the probe of the

Method used

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Embodiment Construction

[0046]Hereinafter, the structure of the direct contact probe card in the present invention will be described in detail with reference to the accompanying drawings.

[0047] When describing the present invention, if it is considered that the description of related known functions or structures will unnecessarily affect the technical idea of ​​the present invention, the description will be omitted. In addition, the terms used below are defined in consideration of the functions in the present invention, and may be changed according to the user's or operator's intention or practice. Therefore, its definition should be defined based on the overall content in this specification.

[0048] image 3 It is a schematic structural diagram of the direct contact probe card involved in the present invention; Figure 4 It is a schematic diagram of the back structure of the direct contact probe card involved in the present invention; Figure 5 It is a sectional view of the direct contact pr...

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Abstract

The present invention relates to a direct contact type probe card which is a double-plate probe card, wherein the probe card comprises the following components: a main PCB which is of a disc shape, is formed with a quadrilateral opening at the central part and is formed with FPCB contact tables on two side surfaces; a plate which is a square component formed by steel and is connected with the bottom central part of the main PCB; a plurality of probe blocks which are arranged with a plurality of probes on the upper ends of the probe blocks and are fixedly equipped on the plate and projects from the upper surface of the main PCB; an FPCB which is formed with a probe contact table on one end and is formed with a PCB contact table corresponding with the FPCB contact table of the main PCB; FPCB blocks which are respectively provided at the side surface of each probe block and has an upper surface fixedly adhibited with the probe contact table of the FPCB; and an extrusion which is used for squeezing the PCB contact platform of the FPCB and the FPCB contact platform of the main PCB. The direct contact type probe card of the invention can simplify the structure and cancel the wiring and welding position for relatively reducing the incidence of undesirable phenomena and shortening the manufacturing time.

Description

technical field [0001] The present invention relates to a direct contact probe card (direct contact probe card), in particular to a flexible printed circuit board (FPCB) respectively forming a needle block (Needle block) and an FBCB formed with a probe contacting the needle block. ) block, which is then combined with a separate board, and a direct-contact probe card that combines the board with a printed circuit board (PCB). Background technique [0002] Probe cards are used in testing operations to confirm the quality of semiconductor devices. Recently, since semiconductor elements are packaged in various forms, probe cards are also designed in various forms according to the packaging forms of semiconductor elements to be tested. [0003] figure 1 A schematic plan view showing a conventional single-board probe card (Needle Probe Card) 10 . Generally, the probe card 10 includes: a probe fixing substrate 12 such as a PCB substrate or an Al substrate; a plurality of probes ...

Claims

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Application Information

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IPC IPC(8): G01R1/067G01R1/073
CPCG01R1/07307G01R31/2601
Inventor 李橡鲁权泰暻
Owner UBPRECISION
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