Electronic load precise dual-temperature correction method and circuit

Abstract

The invention discloses an electronic load precise dual-temperature correction method. The method includes the steps of obtaining a referential correction value under the current environment temperature, conducting correction on a tensile load value obtained through measurement under the current environment temperature according to the referential correction value so that the influence on factors such as temperature drifting of circuit components can be eliminated, thereby obtaining an actual tensile load value under the current environment temperature, conducting comparison operation through the actual tensile load value under the current environment temperature and a set value which is stored in a calculating and processing unit in advance, and obtaining a precise correction value, and outputting the precise correction value to a tensile load circuit so that the tensile load value in the tensile load circuit can be changed and the tensile load value in the tensile load circuit can be accurately corrected. The invention further discloses an electronic load precise dual-temperature correction circuit.

Description

technical field [0001] The invention relates to electronic load technology, in particular to an electronic load precision double temperature correction method and circuit. Background technique [0002] When the electronic load works for a long time and under different temperature backgrounds, due to the temperature coefficient of the components, there will be temperature drift of the load and the measured value. Even if all components use components with extremely low temperature coefficients, the temperature drift of the loading and measured values ​​will be caused by the cumulative error of the temperature coefficients of the components. It cannot meet the precise test requirements of military power supplies and medical power supplies, which increasingly require precision and strictness. For the test of this kind of precision power supply, it is required to correct the load of the tested electronic load and the temperature drift of the measured value, so that the entire e...

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Problems solved by technology

This electronic load temperature correction method, the measured load value under the current ambient temperature is not the actual load value under the current ambient temperature due to the influence of factors such as the temperature drift of the circuit components, but There is a certain error, which will lead to errors in the correction of the load value, that is, the accuracy is not high

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