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Improving Methods for Testing SMD Quartz Crystal Resonators Using a Network Analyzer

A network analyzer and resonator technology, applied in the field of component manufacturing, can solve the problems of reducing test accuracy, affecting test accuracy and efficiency, and increasing the risk of misoperation, so as to achieve the effects of improving test accuracy, easy promotion, and reducing scrap rate

Active Publication Date: 2018-06-22
LANGFANG CHINA ELECTRONICS PANDA CRYSTAL TECH
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AI Technical Summary

Problems solved by technology

Frequent replacement of test slots and calibration will reduce test accuracy, increase the risk of misoperation, and affect test accuracy and efficiency

Method used

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  • Improving Methods for Testing SMD Quartz Crystal Resonators Using a Network Analyzer
  • Improving Methods for Testing SMD Quartz Crystal Resonators Using a Network Analyzer
  • Improving Methods for Testing SMD Quartz Crystal Resonators Using a Network Analyzer

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Embodiment Construction

[0019] A design method for improving the normal temperature characteristics of an SMD quartz crystal resonator using a network analyzer, comprising the steps of:

[0020] 1) By making statistics on the pad size of the resonator base of common models;

[0021] 2) Calculate the contact position parameters that can be applied to the corresponding pad (see Table 1);

[0022] 3) According to the contact position parameters, change the contact design of the test slot from the traditional dot shape to the strip shape (see figure 2 ), thus applicable to all sizes of resonators.

[0023] Such as figure 2 Shown: network analyzer test slot, abandoning the crystal placement slot, redesigning two contact pieces (9), enlarging its area and designing its shape, so that crystal resonators of different types and sizes can be placed directly On the contact sheet (9), the crystal is connected to the test module of the network analyzer through the contact sheet (9), the connecting column (11...

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Abstract

The present invention is a design method for improving the normal temperature characteristics of SMD quartz crystal resonators by using a network analyzer. The contact position parameters of the pad; 3) According to the contact position parameters, the contact design of the test slot is changed from the traditional dot shape to the strip shape, so that it is suitable for resonators of all sizes. Advantages: Applicable to resonators of all sizes, realizing high-reliability contact and high-precision testing of room temperature characteristics of quartz crystal resonators of different specifications and sizes, so that testing resonators of different specifications does not require replacement of test slots and calibration, improving testing precision and work efficiency. It has promotional value for improving the test efficiency of similar products.

Description

technical field [0001] The invention relates to a design method for improving the normal-temperature characteristics of an SMD quartz crystal resonator tested by using a network analyzer, and belongs to the field of element and device manufacturing. Background technique [0002] At present, the common package sizes of SMD quartz crystal resonators are 7.0*5.0mm, 6.0*3.5mm, 5.0*3.2mm, 4.0*2.5mm, 3.2*2.5. With mobile communications, consumer electronics, car audio and video, and IT information, electronic components including SMD quartz crystal resonators are required to be miniaturized, and smaller packages are gradually appearing, such as 2.5*2.0mm, 2.0 *1.6mm, 1.6*1.2mm. In the production process of SMD quartz crystal resonators, it is necessary to use the network analyzer to test the room temperature characteristics of the resonator many times. As the core connection device between the network analyzer and the SMD quartz crystal resonator, the test socket must also adapt ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 白利才吴敬军卞玉
Owner LANGFANG CHINA ELECTRONICS PANDA CRYSTAL TECH
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