A Segmented Variable Step Size Simulated Annealing Method Applied to Phase Difference Wavefront Sensing
A wavefront sensing and simulated annealing technology, applied in the optical field, can solve the problems of slow convergence and premature maturity, and achieve the effect of preventing premature termination.
Active Publication Date: 2019-08-27
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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[0020] In order to solve the technical problems of slow convergence or premature convergence in the traditional constant step size simulated annealing method, the present invention provides a piecewise variable step size simulated annealing method customized for phase difference wavefront distortion inversion
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[0044]Simulated annealing is a simulation of the physical process of real annealing (quenching). At first, when the burning metal with extremely high temperature is suddenly put into liquid water at room temperature, the physical state of its internal atoms will change suddenly in a very short time; after that, as time goes on, the physical state will gradually change. tends to balance. It can be seen that this itself reflects a problem: annealing is a nonlinear function of the time variable. Corresponding to optimization, in the initial stage of iterative optimization, the function value of the objective function deviates greatly from the global optimum, and the disturbance amount must be large enough (sudden change) to approach the minimum value as soon as possible. If you continue to use the same The amount of disturbance, then simulated annealing may fall into premature convergence. Therefore, the present invention proposes a strategy of setting disturbances of different...
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The invention belongs to the field of optics, and in particular relates to a segment variable step size simulated annealing method applied to phase difference wave-front sensing. The segment variable step size simulated annealing method comprises the steps of 1] importing a current solution x0 of an objective function which takes a system wave-front Zernike coefficient as a variable; 2] setting the initial annealing temperature, an upper limit of the number of iterations T and a termination residual S; 3] for an initial segment, setting a disturbance scale between -<delta> and +<delta>, and iteratively running for the number of a times; 4] for an intermediate segment, setting the disturbance scale between -<phi> and +<phi>, and iteratively running until a wave-front reconstruction residual RMS is less than the set termination residual S or the accumulative number of iterations t reaches the set upper limit of the number of iterations T; and 6] ending the simulated annealing process and outputting the solution xt of the objective function at the moment. The segment variable step size simulated annealing method provided by the invention solves the technical problem of slow or premature convergence in a conventional constant step size simulated annealing method.
Description
technical field [0001] The invention belongs to the field of optics, and in particular relates to a simulated annealing method with segmental variable step length applied to phase difference wavefront sensing. Background technique [0002] An adaptive optics system usually consists of three parts: a wavefront sensor, a wavefront corrector, and a wavefront controller. Among them, the wavefront sensor shoulders the important task of obtaining the optical wavefront distortion of the system, and is the input end of the entire adaptive optics system. Commonly used wavefront sensing technologies today include: shearing interferometers, curvature sensors, pyramidal mirror sensors, and Shack-Hartmann sensors. These techniques all require the introduction of special hardware, and some of them can only implement wavefront inversion calculations for point light sources, so they are limited in the breadth of application. At present, a new wavefront sensing technology based on image pr...
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IPC IPC(8): G06Q10/04
Inventor 赵惠解晓蓬易红伟樊学武
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI