Array substrate, detection circuit and method for detecting open circuit and short circuit of array substrate

A technology for detecting circuits and array substrates, applied in static indicators, instruments, etc., can solve problems such as affecting the normal display of display devices, scratching the wiring of the array substrate, and wiring disconnection or short circuit, so as to avoid the effect of normal display.

Active Publication Date: 2017-01-25
SHANGHAI TIANMA MICRO ELECTRONICS CO LTD +1
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the process of cutting and transporting the array substrate, it is easy to scratch the traces on the array substrate, such as gate lines and data lines, etc., resulting in disconnection or short circuit of the traces, which affects the normal display of the display device.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array substrate, detection circuit and method for detecting open circuit and short circuit of array substrate
  • Array substrate, detection circuit and method for detecting open circuit and short circuit of array substrate
  • Array substrate, detection circuit and method for detecting open circuit and short circuit of array substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0027] An embodiment of the present invention provides a detection circuit, such as figure 1 as shown, figure 1 A schematic structural diagram of a detection circuit provided by an embodiment of the present invention, the detection circuit is applied to an array substrate including a plurality of wires S1-Sn, that is, the detection circuit is used to detect whether the wires S1-Sn on the array substrate appear short circuit or open circuit condition. Optiona...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an array substrate, a detection circuit and a method for detecting open circuit and short circuit of the array substrate. The detection circuit comprises a plurality of first switch tubes, a plurality of second switch tubes, a plurality of first devices, first to sixth input ends, a first output end and a second output end, wherein a first level signal is input to the first input end, the second input end, the fifth input end and the sixth input end, and a second level signal is input to the third input end and the fourth input end, thus whether wires are open circuit can be determined; the first level signal is input to the second input end, the fourth input end and the fifth input end, and the second level signal is input to the first input end, whether the signal output by the first output end is the second level signal is detected to determine whether the wires are short circuit. By adopting the detection circuit, the short circuit or open circuit of the wires on the array substrate is avoided so as not to influence normal display of a display device.

Description

technical field [0001] The present invention relates to the technical field of display devices, and more specifically, to an array substrate, a detection circuit, and a detection method for open circuit and short circuit. Background technique [0002] In the prior art, multiple array units are fabricated on the same substrate at the same time, and then the array units are cut after fabrication to form individual array substrates. Afterwards, the array substrate and the electronic paper film are pasted together to form an electronic paper display device. However, in the process of cutting and transporting the array substrate, it is easy to scratch the traces on the array substrate, such as gate lines and data lines, etc., resulting in disconnection or short circuit of the traces, which affects the normal display of the display device. . Contents of the invention [0003] In view of this, the present invention provides an array substrate, a detection circuit and an open ci...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 宋伯龙
Owner SHANGHAI TIANMA MICRO ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products