Mask comprising monitored patterns, and monitoring method
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SEMICON MFG INT (SHANGHAI) CORP
- Publication Date
- 2017-08-15
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Abstract
Description
technical field
[0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a mask plate containing monitoring patterns and a monitoring method. Background technique
[0002] In the field of integrated circuit manufacturing, photolithography is used to transfer patterns from a photolithographic mask containing circuit design information to a wafer (wafer). The photolithographic mask, also known as photolithography A plate, a mask plate or a photomask is a flat plate with light transmission to the exposure light, and has at least one geometric figure with light shielding on the exposure light, which can selectively block the photoresist on the surface of the wafer The light on the wafer finally forms a corresponding pattern on the photoresist on the surface of the wafer.
[0003] In semiconductor manufacturing, how to ensure that the geometric figures defining the design graphics are accurately formed on the mask plate is one of the k...