An online examination cheating judgment method based on Kinect color and depth information
A depth information, color technology, applied in the direction of instrument, calculation, acquisition/recognition of facial features, etc., can solve problems such as lack of credibility, and achieve the effect of improving recognition ability and accuracy, wide application prospects, and improved recognition efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0081] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0082] A method for judging cheating in online exams based on Kinect color and depth information, its steps are as follows:
[0083] (1) Acquisition of facial and torso movement data, specifically including the following sub-steps:
[0084] (1.1) 10 groups of test volunteers simulated the online test situation, respectively simulating normal answering and attempting to cheat.
[0085] (1.2) Place the Kinect in front of the examiner's computer, and use the software to collect real-time facial feature point information and upper body movement feature point information.
[0086] (2) Face and trunk movement data preprocessing, specifically including the following sub-steps:
[0087] (2.1) Carry out denoising processing to the face feature points and body movement feature points extracted from Kinect respectively, get rid of some noise points that Kinect take...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com