Fault detection device for electronic chip

Abstract

The invention provides a fault detection device for an electronic chip. The device comprises a software detection module, a hardware detection module, an operation state detection module and a generation module, wherein the software detection module comprises a processing unit, an input unit and an output unit, the input unit is connected to an input interface of a chip to be detected, the outputmodule is connected to an output interface of the chip to be detected, the processing unit inputs a test sample to the chip to be detected through the input unit, receives an output result of the chipto be detected through the output unit, and detects the correctness of the output result; the hardware detection module is used for acquiring a chip image to be detected, and detecting an external defect of the chip to be detected through the chip image to be detected; the operation state detection module is used for detecting the heating temperature of the chip to be detected during operation; and the generation module generates a fault detection report of the chip to be detected through the output results of the software detection module, the hardware detection module and the operation state detection module. According to the device, multi-aspect fault detection and evaluation can be carried out on the electronic chip, and the requirements for comprehensive detection of the electronic chip are met.

Description

technical field [0001] The invention relates to the technical field of chip detection, in particular to an electronic chip fault detection device. Background technique [0002] Electronic chips are integrated circuits formed by a large number of microelectronic components on a substrate to form electronic chips; electronic chips are currently widely used in public facilities such as computers, consumer electronics, network communications, and automotive electronics. [0003] Due to the high integration of electronic chips, in the prior art, there are also some devices for fault detection of electronic chips, but these devices can only detect the correctness of the logic functions of electronic chips, and the function is single, which cannot meet the requirements of electronic chips. The need for comprehensive fault detection. Contents of the invention [0004] In view of the above problems, the present invention aims to provide an electronic chip fault detection device. ...

AI Technical Summary

Problems solved by technology

[0003] Due to the high integration of electronic chips, in the prior art, there are also some devices for fault detection of electronic chips, but these devices can only detect the correctness of the logic functions of electronic chips, and the function is single, which cannot meet the requirements of electronic chips. The need for comprehensive fault detection

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