An electronic chip fault detection device

Abstract

The present invention proposes an electronic chip fault detection device, comprising: a software detection module including a processing unit, an input unit and an output unit, the input unit is connected to the input interface of the chip to be detected, the output module is connected to the output interface of the chip to be detected, and the processing The unit inputs the test sample to the chip to be tested through the input unit, and the output unit receives the output result of the chip to be tested, and detects the correctness of the output result; the hardware detection module is used to obtain the image of the chip to be tested, through The image of the chip to be detected detects the external defects of the chip to be detected; the running state detection module is used to detect the heating temperature of the detection chip when it is running; the generation module is output by the software detection module, the hardware detection module and the running state detection module. Generate a fault detection report of the chip to be tested. The invention performs multi-faceted fault detection and evaluation on the electronic chip, meeting the requirement of comprehensive detection on the electronic chip.

Description

technical field [0001] The invention relates to the technical field of chip detection, in particular to an electronic chip fault detection device. Background technique [0002] Electronic chips are integrated circuits formed by a large number of microelectronic components on a substrate to form electronic chips; electronic chips are currently widely used in public facilities such as computers, consumer electronics, network communications, and automotive electronics. [0003] Due to the high integration of electronic chips, in the prior art, there are also some devices for fault detection of electronic chips, but these devices can only detect the correctness of the logic functions of electronic chips, and the function is single, which cannot meet the requirements of electronic chips. The need for comprehensive fault detection. Contents of the invention [0004] In view of the above problems, the present invention aims to provide an electronic chip fault detection device. ...

AI Technical Summary

Problems solved by technology

[0003] Due to the high integration of electronic chips, in the prior art, there are also some devices for fault detection of electronic chips, but these devices can only detect the correctness of the logic functions of electronic chips, and the function is single, which cannot meet the requirements of electronic chips. The need for comprehensive fault detection

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