An electronic chip fault detection device

A fault detection and electronic chip technology, which is applied in electronic circuit testing, television, color TV, etc., can solve problems such as single function, high integration of electronic chips, and inability to meet the fault detection of electronic chips, and achieve the effect of accurate performance

Active Publication Date: 2020-01-14
深圳市阿赛姆电子有限公司
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Problems solved by technology

[0003] Due to the high integration of electronic chips, in the prior art, there are also some devices for fault detection of electronic chips, but these devices can only detect the correctness of the logic functions of electronic chips, and the function is single, which cannot meet the requirements of electronic chips. The need for comprehensive fault detection

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  • An electronic chip fault detection device
  • An electronic chip fault detection device
  • An electronic chip fault detection device

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Embodiment Construction

[0057] The present invention will be further described in conjunction with the following application scenarios.

[0058] see figure 1 , figure 2 , which shows an electronic chip failure detection device, comprising:

[0059] Software detection module 1, comprises processing unit 11, input unit 12 and output unit 13, and input unit 12 is connected with the input interface of chip to be tested, and output unit is connected with the output interface of chip to be tested, and processing unit 11 will test by input unit 12 The sample is input to the chip to be tested, and the output result of the chip to be tested is received through the output unit 13, and the correctness of the output result is checked;

[0060] The hardware detection module 2 is used to obtain the image of the chip to be detected, and detect the external defect of the chip to be detected through the image of the chip to be detected;

[0061] The operating state detection module 3 is used to detect the heating t...

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Abstract

The present invention proposes an electronic chip fault detection device, comprising: a software detection module including a processing unit, an input unit and an output unit, the input unit is connected to the input interface of the chip to be detected, the output module is connected to the output interface of the chip to be detected, and the processing The unit inputs the test sample to the chip to be tested through the input unit, and the output unit receives the output result of the chip to be tested, and detects the correctness of the output result; the hardware detection module is used to obtain the image of the chip to be tested, through The image of the chip to be detected detects the external defects of the chip to be detected; the running state detection module is used to detect the heating temperature of the detection chip when it is running; the generation module is output by the software detection module, the hardware detection module and the running state detection module. Generate a fault detection report of the chip to be tested. The invention performs multi-faceted fault detection and evaluation on the electronic chip, meeting the requirement of comprehensive detection on the electronic chip.

Description

technical field [0001] The invention relates to the technical field of chip detection, in particular to an electronic chip fault detection device. Background technique [0002] Electronic chips are integrated circuits formed by a large number of microelectronic components on a substrate to form electronic chips; electronic chips are currently widely used in public facilities such as computers, consumer electronics, network communications, and automotive electronics. [0003] Due to the high integration of electronic chips, in the prior art, there are also some devices for fault detection of electronic chips, but these devices can only detect the correctness of the logic functions of electronic chips, and the function is single, which cannot meet the requirements of electronic chips. The need for comprehensive fault detection. Contents of the invention [0004] In view of the above problems, the present invention aims to provide an electronic chip fault detection device. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01R31/28H04N5/225G03B15/05G03B15/02
Inventor 孙磊许海财陈伦森
Owner 深圳市阿赛姆电子有限公司
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