Method and device for testing storage device and equipment

A technology for storing equipment and equipment information, applied in the field of storage, which can solve the problems of long time period, substandard test of storage equipment, and extended test period.

Active Publication Date: 2019-10-15
SHENZHEN DEMINGLI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Existing solutions for testing storage devices generally integrate multiple testing software and testing processes, and use one-key test operations to test storage devices. There are many items and procedures for testing storage devices. , all need to be manually enabled one by

Method used

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  • Method and device for testing storage device and equipment
  • Method and device for testing storage device and equipment
  • Method and device for testing storage device and equipment

Examples

Experimental program
Comparison scheme
Effect test

example

[0062] Obtain the instance ID (InstanceID) and device path (DevicePath) information of the storage device;

[0063] Obtain the tree results of storage devices, and get all linked storage devices and storage device key name (DeviceKeyName) information;

[0064] Obtain storage device key names and instance ID information of all storage devices in the registry;

[0065] Compare the obtained instance ID and device path information of the storage device, the obtained all linked storage devices and storage device key name information, and the obtained storage device key names and instance ID information of all storage devices in the registry , compare to get the type information of the real storage device;

[0066] According to the type information of the real storage device obtained by the comparison, send the cmd (command, command prompt) of the storage device to obtain the capacity information of the storage device. The advantage of this is that the type information and capacity...

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PUM

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Abstract

The invention discloses a method and a device for testing a storage device and equipment. The method comprises the following steps: acquiring equipment information of the storage device, and acquiringequipment information according to the acquired equipment information, setting a target for testing the storage device; and a target according to the setting, guiding the set test software and toolsto be started by the general software; starting planned test items and processes; and testing items and processes according to the opened plan, starting set test software and tools to test the storagedevice under the guidance of total software, obtaining all control handles in a window of the storage device, obtaining a test result of the storage device, and generating a test report for testing the storage device according to the obtained test result. By means of the mode, the testing process for testing the storage device can be simplified, the storage device can be prevented from being automatically tested in a manual mode, the testing efficiency is improved, and the accuracy of the testing result is high.

Description

technical field [0001] The present invention relates to the technical field of storage, in particular to a method, device and equipment for testing a storage device. Background technique [0002] A storage device is a device used to store information, usually digitized and then stored using electrical, magnetic or optical media. [0003] After the storage device is generated, it generally goes through two processes: mass production and testing. Mass production, that is, the mass production software sends commands through the main control chip, writes and reads the physical data of the storage wafer, and obtains the physical good blocks and bad blocks, and then counts and sorts the good physical data blocks to obtain the sorting After the logical data storage block process. Test, that is, conduct a comprehensive test process on the data, format, attributes, storage methods, writing and reading methods of the logical storage unit after mass production, so as to obtain the pr...

Claims

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Application Information

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IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 李虎李正
Owner SHENZHEN DEMINGLI ELECTRONICS
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