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Image exposure parameter measuring method and device

A technology of exposure parameters and images, applied in image communication, TV, color TV parts, etc.

Active Publication Date: 2020-09-29
BEIJING MOMENTA TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The invention provides a method and device for measuring image exposure parameters to more accurately determine image exposure parameters

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  • Image exposure parameter measuring method and device
  • Image exposure parameter measuring method and device
  • Image exposure parameter measuring method and device

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Embodiment Construction

[0102] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0103] It should be noted that the terms "include" and "have" and any variations thereof in the embodiments of the present invention and the drawings are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units that are not listed, or optionally further includes For other steps or units inher...

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Abstract

The embodiment of the invention discloses an image exposure parameter measuring method and device. The method comprises the following steps: acquiring detection images acquired by image acquisition equipment for a plurality of light-emitting units of the target plate equipment when the target plate equipment works; determining an image exposure parameter of the image acquisition device according to the light emitting units in the light emitting state in the unit column and the carry column of the detection image and the cycle index corresponding to the light emitting units in the set time interval and the carry column, wherein the light-emitting units comprise a unit column and a carry column, the light-emitting units of the unit column are sequentially lightened according to a set time interval when the target plate equipment works, and the light-emitting units of the carry column are sequentially lightened according to the number of cycles of light-emitting cycles completed by all the light-emitting units of the unit column. By applying the method disclosed in the solution provided by the embodiment of the invention, the image exposure parameters can be determined accurately.

Description

technical field [0001] The present invention relates to the technical field of automatic driving, in particular to a method and device for measuring image exposure parameters. Background technique [0002] With the development of science and technology, the application of image acquisition equipment is more and more extensive. For example, in the field of monitoring, detection, and automatic driving, the images collected by image acquisition equipment can provide data support for specific analysis. In practical applications, not only images are used, but also each image needs to be associated with real-world time for multi-dimensional decision-making operations. Accurately determining the real exposure time of an image is very important in some application fields, such as the field of automatic driving. [0003] The image acquisition device sends a specific signal when acquiring an image, and the time when the image acquisition device sends the specific signal can be used ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/235H04N17/00
CPCH04N17/002H04N23/73
Inventor 梁煜彬于超
Owner BEIJING MOMENTA TECH CO LTD
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