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Automatic film thickness test and pressure resistance test equipment

A technology of withstand voltage test and film thickness, applied in the direction of testing dielectric strength, measuring devices, instruments, etc., can solve the problems of film thickness detection and withstand voltage detection cannot be combined into a pipeline, low film thickness detection efficiency, etc. The effect of detection efficiency and automation, improving test efficiency, and improving practicability

Pending Publication Date: 2022-01-28
华虔智能科技(苏州)有限公司
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  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide an automatic film thickness test and withstand voltage test equipment to solve the problem that the film thickness test and withstand voltage test cannot be combined into one assembly line in the technology, and the problem of low film thickness test efficiency

Method used

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  • Automatic film thickness test and pressure resistance test equipment
  • Automatic film thickness test and pressure resistance test equipment
  • Automatic film thickness test and pressure resistance test equipment

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Embodiment Construction

[0027] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0028] The present invention provides such Figure 1-5 The shown automatic film thickness test and withstand voltage test equipment includes a main body shell 1 of the equipment. A film thickness mechanism 4 is installed, a spider manipulator 5 is also arranged on the bottom plate 2, a manipulator clamp 501 is installed on the spider manipulator 5, a discharge flow line 6 is arranged in the main body shell 1 of the equipment, and the end of the discharge flow line 6 is provided with Clean the streamline drum 601, the discharge streamline 6 is provided with a photoelectric blocking mechanism 602, the bottom plate 2 is provided with a pressure-resistant mechanism 7, and the bottom surfaces of the film thickness mechanism 4 and the pressure-resistan...

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Abstract

The invention discloses automatic film thickness test and pressure resistance test equipment, which comprises an equipment main body shell, wherein a bottom plate is arranged in the main body shell, a feeding streamline is arranged in the main body shell, a film thickness mechanism is mounted on the bottom plate, a spider manipulator is further arranged on the bottom plate, a manipulator clamp is mounted on the spider manipulator, a discharging streamline is arranged in the main body shell, a cleaning streamline roller is arranged at the end of the discharging streamline, a photoelectric blocking mechanism is arranged on the discharging streamline, and a pressure resisting mechanism is arranged on the bottom plate. According to the invention, through testing of a second station, a third station and a fourth station of a film thickness mechanism, the testing efficiency is improved, and six defective products can be stored in batches at a time; through testing of a manipulator and a pressure resisting module, detection of four production lines of products and cleaning of the four production lines are achieved, the service life of the equipment is prolonged, the practicability of the equipment is greatly improved, and multi-functionalization is realized.

Description

technical field [0001] The invention relates to the technical field of film thickness and withstand voltage detection, in particular to an automatic film thickness test and withstand voltage test equipment. Background technique [0002] With the improvement of people's living standards, the demand for electronic products has also risen to the pursuit of product performance. The appearance of electronic products must not only meet the needs of the public, but the performance of the products must also be stable and durable. Testing before the products are launched The work is indispensable. The film thickness and withstand voltage detection of the product are relatively important procedures in the detection process, which have a direct impact on the performance of the product. These two detection processes often require separate equipment and a separate assembly line. low efficiency. [0003] The existing film thickness and withstand voltage detection of electronic products c...

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Application Information

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IPC IPC(8): G01B11/02G01R31/12
CPCG01B11/02G01R31/12
Inventor 聂立波黄从洋肖铿
Owner 华虔智能科技(苏州)有限公司