Multi-interface parallel test method and system

A multi-interface and interface technology, used in electrical connection testing, continuity testing, components of electrical measuring instruments, etc., can solve the problem that the testing method cannot meet the normal process of testing.

Pending Publication Date: 2022-03-01
WUHAN TIANYU INFORMATION IND
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  • Claims
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Problems solved by technology

[0003] However, with the continuous evolution of test requirements, the test method of a single test interface can no longer satisfy the normal process of testing, and the types of interfaces that can be realized on the product side are also increasing. different testing purposes

Method used

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  • Multi-interface parallel test method and system

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Embodiment 1

[0030] This embodiment discloses a method for multi-interface parallel testing, such as figure 1 ,include:

[0031] S100. The test terminal obtains all types of interfaces to be tested of the product, and determines the corresponding intermediate connection module according to the types of all interfaces to be tested, and connects the test terminal and the interface to be tested through the corresponding intermediate connection module;

[0032] Specifically, in this implementation, all types of interfaces to be tested on the product include at least: 7816 interface, 14443 interface, bluetooth interface, nfc interface, wifi interface, serial port, SPI interface and IIC interface. The intermediate connection modules used by different test interfaces are not the same, and can be uniformly named as the corresponding module names. The test end of the intermediate connection module is connected to the interface to be tested, and the test end is connected to different interface modu...

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Abstract

The invention discloses a multi-interface parallel test method, which comprises the following steps that: a test end obtains all to-be-tested interface types of a product, prepares corresponding intermediate connection modules according to all to-be-tested interface types, and connects the test end and to-be-tested interfaces through the corresponding intermediate connection modules; the test end sends a test instruction to the corresponding to-be-tested interface through the intermediate connection module; and the to-be-tested interfaces receive a test instruction sent by the test end, and perform corresponding processing on all the to-be-tested interfaces according to the test instruction. According to the invention, different types of interfaces can be tested at the same time, various types of interfaces are transferred uniformly, and fine testing is completed on multiple interfaces in a real-time and concurrent manner.

Description

technical field [0001] The invention relates to the field of interface testing, in particular to a method and system for parallel testing of multiple interfaces. Background technique [0002] Testing plays an important role in product development. Whether a product can be released must first pass feasibility and functional tests. At present, the existing product testing often adopts a single interface test form, taking the smart card test as an example, it is commonly used to connect the test PC with the 7816 interface. [0003] However, with the continuous evolution of test requirements, the test method of a single test interface can no longer satisfy the normal process of testing, and the types of interfaces that can be realized on the product side are also increasing. Different test uses. For different types of interfaces, how to schedule them uniformly and confirm the real-time concurrent completion of refined testing is an urgent problem at this stage. Contents of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R31/54G01R31/68
CPCG01R1/0416G01R31/54G01R31/68
Inventor 李超苏昆胡瑞璟董逢华
Owner WUHAN TIANYU INFORMATION IND
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