Sample supporting device for microscopic observation

Abstract

The invention discloses a sample supporting device for microscopic observation, and relates to the technical field of optical microscope measurement, the sample supporting device comprises a shell assembly and a sample supporting tube, the shell assembly is internally provided with a vessel body, and one side, close to a pipettor connecting part, of the sample supporting tube is movably sleeved with a first transmission part; the first transmission part is distributed between the side wall of the dish body and the pipettor connecting part, the metal plate is fixedly connected to the side wall of the dish body, the adjusting part is rotatably connected between the side wall of the dish body and the metal plate, one end of the adjusting part is movably connected with one end, close to the pipettor connecting part, of the sample supporting tube, and the other end of the adjusting part is movably connected with the pipettor connecting part. The other end of the adjusting part is rotationally connected to the side wall of the dish body, a second transmission part is arranged in the adjusting part, one end of the first transmission part and one end of the second transmission part are both movably connected with the inner side of the adjusting part, and the other end of the first transmission part and the other end of the second transmission part are both movably connected to the metal plate; and internal parts of the first transmission part and the second transmission part are consistent in composition.

Description

technical field [0001] The invention relates to the technical field of optical microscope measurement, in particular to a sample support device for microscopic observation. Background technique [0002] Optical microscopy technology includes optical microscopy technology and optical microfilming technology. Optical microscopy is an instrument that uses visible light as a light source to magnify the observed object through a set of glass lenses including eyepieces, objective lenses, and condensers to improve resolution. When observing a sample, first place the sample in a special petri dish, then place the petri dish containing the sample on the stage, and finally adjust the position of the petri dish or the sample in the petri dish and adjust the position of the optical lens. The parameter method achieves the purpose of observing the sample. [0003] Publication No. CN108593549B discloses a sample support device for microscopic observation, including a sample support tube, ...

AI Technical Summary

Problems solved by technology

[0003] Publication No. CN108593549B discloses a sample support device for microscopic observation, including a sample support tube, a dish body and a rotating adjustment part, which not only can prepare samples conveniently and quickly, but also eliminates the need to trim the gel block after removing the sample preparation After the sample is prepared, the sample support tube can be rotated through the rotating adjustment part according to the needs of the experimenter, and the body posture of the sample can be adjusted to the optimal state for observation. Such a problem, but the patent does not give how to precisely adjust the position of the dish on the stage after the dish is placed on the stage of the optical microscope, that is to say, it does not give the precise adjustment of the dish. The horizontal distance between the sample support tube and the optical lens in the body is limited, and the setting of the rotation adjustment part can only adjust the rotation angle of the sample support tube, and the level between the sample support tube and the optical lens cannot be precisely adjusted by the rotation adjustment part. distance

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