Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

3results about How to "Reduce analysis time" patented technology

Forced assignment statement processing method based on release statement, electronic equipment and medium

PendingCN121996681ASave simulation memory spaceReduce analysis timeDigital data information retrievalSpecial data processing applicationsRelational databaseTarget line
The invention relates to the technical field of digital simulation, in particular to a forced assignment statement processing method based on a release statement, electronic equipment and a medium. The method comprises the following steps: recording a mapping relation between a line network signal action bit and a top layer signal bit in a forced assignment statement in a first relation database, and selecting a target line network signal; recording a mapping relation between a top-layer signal bit and a corresponding compulsory assignment module identifier list in a second relation database, and then dynamically recording a mapping relation between a top-layer signal and a compulsory assignment module in a dynamic database; and updating the dynamic database and modifying the state of the enforced assignment module which is currently in an active state in the corresponding enforced assignment module identification list into a state which needs to be confirmed, and when the assignment content of the target line network signal is changed, confirming and updating the state of the involved enforced assignment module in combination with the second relational database. And executing the forced assignment updating operation which really needs to be executed. The system performance is improved.
Owner:成都融见软件科技有限公司 +1

Synchronous measurement method and system for three-dimensional displacement field of transparent soil based on binocular vision

This application discloses a method and system for synchronous measurement of three-dimensional displacement field of transparent soil based on binocular vision. This application improves upon current displacement field measurements that require full-field matching. First, a local comparison window is defined for the current speckle grid. The similarity of the speckle grid in the local comparison window at time t+1 is compared with the current speckle grid to determine its position. Then, the displacement vector of the speckle grid can be determined by directly assigning the vectors of other speckle grids with similar speckle density within the local comparison window to this displacement vector. Thus, the displacement vectors of multiple speckle grids can be obtained after calculating the displacement vector of only one speckle grid, effectively reducing the amount of data processing.
Owner:THE THIRD ENG CO LTD OF THE HIGHWAY ENG BUREAU OF CCCC +1

A system for qualitatively detecting trace amounts of silicon in unknowns

The utility model discloses a system for qualitative detection trace silicon in unknown object, including generator, sodium hydroxide feed arrangement, gas detection device and emptying device, and the generator includes generator body and sets the thing tray in the generator body, is equipped with the opening on the generator body upper end, is equipped with the sealing plug in the opening, is equipped with the through -hole I, through -hole II and through -hole III for device installation on the sealing plug, the thing tray is the thing tray of mesh adjustable, and sodium hydroxide feed arrangement includes feeding hopper and feed pipe, and gas detection device includes detection tube and the piston of setting in detection tube, is equipped with the scale on detection tube, and emptying device includes emptying air pipe, pipette and liquid tank, is equipped with the check valve on emptying air pipe, and pipette end extends to below liquid level in liquid tank, is equipped with the scale on pipette. The system can realize qualitative detection trace silicon in unknown object fast, efficiently, and the error is less, to provide reference basis for silicon analysis in unknown sample.
Owner:SICHUAN YONGXIANG CO LTD