Raw film for retardation film, retardation film, and liquid-crystal display
一种相位差薄膜、薄膜的技术,应用在液晶材料、仪器、光学等方向,能够解决正面对比度降低、薄膜透明性降低、相位差不均等问题,达到内部浊度低、正面对比度优良的效果
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Embodiment 1
[0105] A propylene-ethylene random copolymer (MFR=8g / 10min, ethylene content=4.6% by weight) was added to a 50mmφ extruder with a cylinder temperature set at 250°C for melt kneading, extruding at 13kg / h The output was extruded from a 450 mm wide T-die mounted on the above-mentioned extruder. The extruded molten sheet is nip-cooled by a 250mmφ cooling roll whose temperature is adjusted to 13°C, a metal sleeve (outer cylinder) whose temperature is adjusted to 13°C, and a touch roll composed of an elastomer roll inside. , to obtain a film with a thickness of 100 μm. The nip line pressure at this time was 5 N / mm, and buildup did not occur between the cooling roll and the touch roll. The distance between the discharge port of the T-die and the roll (air chamber) was 20 mm, and the distance between the cooling roll and the touch roll for nipping the sheet was 10 mm. Various samples for evaluation were collected from the films thus obtained. The melting point of the sample was 136...
Embodiment 2
[0110] A propylene-ethylene random copolymer (MFR=1.5g / 10 minutes, ethylene content=5.7% by weight) was added to a 65mmφ extruder with a cylinder temperature set at 240°C for melt kneading at a rate of 46kg / h The extruded amount was extruded from a 1200 mm wide T-die installed in the above-mentioned extruder. The extruded molten sheet is nip-cooled by a 400mmφ cooling roll whose temperature is adjusted to 13°C, a metal sleeve (outer cylinder) whose temperature is adjusted to 13°C, and a touch roll composed of an elastomer roll inside it, A thin film with a thickness of 200 μm was obtained. The air chamber was 150 mm, and the distance between the cooling roll and the touch roll to nip the sheet was 20 mm. Various samples for evaluation were collected from the films thus obtained. The melting point of the sample was 129° C., and the in-plane retardation was 3025 nm. In the entire area of the X-ray diffraction curve of the sample, the ratio of the area under the curve origin...
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