Multi-link parallel boundary scanning testing device and method

Abstract

The invention discloses a multi-link parallel boundary scanning testing device and method. The device comprises a testing controller and scanning control units which correspond to boundary scanning chains to be tested one by one, wherein each scanning control unit comprises a multi-link control logic and test data input port, a test result output port, a controller interface and a boundary scanning chain interface. The method comprise the following steps: (1) the testing controller transmits an invalid signal, and detects the quantity of all boundary scanning chains to be tested which are arranged in parallel; (2) the testing controller sets a scanning selection code, and transmits the scanning selection code to each scanning control unit; (3) the testing controller outputs a valid signal, and the scanning control units control the selection and switch-off of the boundary scanning chains to be tested according to the scanning selection codes; and (4) the test controller outputs boundary scanning test data, and the scanning control units test the selected boundary scanning chains to be tested and transmit a final test result to the testing controller. The device and the method have the advantages of high testing efficiency, and easiness and convenience for using.

Description

technical field [0001] The invention relates to the field of boundary scan testing, in particular to a multi-link parallel boundary scan testing device and method. Background technique [0002] Boundary Scan Test (BST-Boundary Scan Test) technology is a technology that directly designs testability into the chip. It is aimed at solving chip-level to system-level testing, core logic circuit interconnection testing, digital circuits to analog circuits or A series of testing techniques for digital circuit testing. The Institute of Electrical and Electronics Engineering (IEEE) standardizes the method of adding boundary-scan testing technology in device design and applying this technology to test devices as IEEE1149 series standards. Since IEEE published the IEEE1149.1 boundary scan standard in 1990, the boundary scan technology has been rapidly developed and applied. Because boundary scan technology can effectively test the correctness of functions and connections of large-scal...

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Problems solved by technology

[0004] Most of the current industry boundary-scan test methods are aimed at figure 1 The single-chain test shown is carried out. There are not many multi-chain parallel test methods for testing two or more boundary-scan chains at the same time. Basically, the tester needs to manually set up multiple boundary-scan chains. This is feasible in most cases, but in some

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