2 results about "Boundary scan testing" patented technology

The application discloses a kind of electric vehicle AC charging pile safety evaluation method and portable detection system.Four voltage sampling points are set under the mouth of remote distribution box switch, the mouth of pile side distribution box switch and gun head, voltage and current are collected synchronously, and the impedance of external cable, the voltage drop of pile side switch and the impedance of charging pile are calculated in sections.In the state of power-off, L-PE / N-PE / L-N insulation resistance is detected preferentially, the risk of zero fire line breakdown discharge is evaluated, and if unqualified, the power-on test is terminated.After passing, the pile is controlled to run continuously with rated load, the temperature rise of remote switch, pile side switch and gun head under full load is directly monitored to evaluate thermal risk, and the protection margin is tested through power boundary scanning.The system uses wireless long-distance communication to realize clock synchronization between distribution end and pile end, all evaluation dimensions are integrated into weighted comprehensive score, combined with time dimension degradation trend and horizontal group comparison, and A / B / C / D four-level safety evaluation grade is output.It is suitable for periodic safety evaluation of in-service AC charging pile.

This invention discloses a BSDL-free model I / O open / short circuit testing system and method. The BSDL-free model I / O open / short circuit testing system, used for boundary scanning, includes: a boundary scanning test card, a constant current source circuit, an ADC acquisition circuit, a switching circuit, an FPGA, and a test host computer. The constant current source circuit, ADC acquisition circuit, and switching circuit are integrated within the boundary scanning device. The output terminal of the constant current source circuit is connected to the BSDL-free model I / O pin of the chip under test (DUT) to output a constant current. The input terminal of the ADC acquisition circuit is connected to the DUT pin to acquire the pin voltage. The switching circuit connects the constant current source circuit and the ADC acquisition circuit to switch the protection diode test type. The ADC acquisition circuit is connected to the FPGA via an I2C interface, and the FPGA communicates with the test host computer. This invention enables open / short circuit testing of BSDL-free model I / O pins within a boundary scanning device, improving test coverage, reducing test costs, and increasing test efficiency.