Boundary scan testing controller and testing method thereof

A boundary scan test and controller technology, applied in the field of electronic communication, can solve the problems of insufficient test speed and inability to realize parallel operation, etc., and achieve the effect of improving test speed and convenient use

Active Publication Date: 2008-01-02
ZTE CORP
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  • Abstract
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  • Application Information

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Problems solved by technology

The test process is: send test data→receive response data→send test data----the test method cannot realize th...

Method used

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  • Boundary scan testing controller and testing method thereof

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Embodiment Construction

[0030] A schematic structure diagram of a boundary-scan test controller is shown in Figure 1, including: a PC unit, a USB interface unit, a dual-port storage unit, and a control and conversion unit.

[0031] Described PC unit adopts VC to realize interface part, sets the clock of boundary-scan test by PC, selects the test item of boundary-scan test, according to the test item of boundary-scan test, produces corresponding test vector, and test vector is sent To the boundary scan test controller, this part will also analyze the test data, realize fault location and store the test results. In addition, the USB driver will complete the drive of the USB2.0 controller to realize the communication between the PC and the USB2.0 controller. communication.

[0032] The USB interface unit adopts the USB2.0 controller of CYPRESS company to realize the communication between the boundary scan test controller and the computer. The data communication between boundary scan test controllers ca...

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Abstract

The invention discloses a controller and testing method of boundary scanning, said controller includes PC unit, USB interface unit, two-end memory unit, control and transforming unit; said PC unit can set test, generate test vector, send and receive test data, analyze test data, store test result and USB drive of controller; said USB interface unit realizes communication between boundary scanning test controller and computer; said two-end memory unit realizes memory of test vector and stores test response; said control and transforming unit generates boundary scanning test clock to realize transforming test data to JTAC signal, and realizes reading and writing of data from two-end memory unit. The invention adopts USB interface, memory of two-end memory unit and FPGA design, plug and play, data transmission and boundary scanning test can be preceded at the same time, test speed is increased.

Description

technical field [0001] The invention relates to the test technology in the field of electronic communication, in particular to a boundary scan test controller and a method for realizing the test by using the boundary scan controller. Background technique [0002] With the continuous development of microelectronics technology, surface mount technology and printed circuit board manufacturing technology, printed circuit boards are becoming smaller, denser and more complex. Faced with such a development trend, if the traditional "bed of needles" fixture test method is still used to test the welding situation thoroughly, not only is it difficult to implement, but the cost of the test fixture is also high. [0003] In the above background, in order to solve the test problems of large-scale integrated circuits, in the mid-1980s, Philips initiated the establishment of the European Joint Test Action Group (Joint European Test Action Group), and began to draft edge scan test specifica...

Claims

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Application Information

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IPC IPC(8): G01R31/28G06F13/00
Inventor 李宏伟李乾坤王晓卿王承
Owner ZTE CORP
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