Boundary scan digital circuit test system and test method thereof based on PXI bus

Abstract

The invention discloses a boundary scan digital circuit test system and a test method thereof based on a PXI bus. The test system comprises a PXI backboard, a main controller, a JTAG controller, 1-N interface expansion modules, 1-M function expansion modules and an adapter board. The PXI backboard is connected with the main controller, the JTAG controller, the interface expansion modules and the function expansion modules; the adapter board is connected with the main controller, the JTAG controller, the interface expansion modules and the function expansion modules; and the main controller is connected with a keyboard and a mouse of a computer through a USB interface, and is connected with a displayer of the computer through a DVI. The boundary scan digital circuit test system has an advanced framework and high expandability, can solve the problem that since the existing test equipment is highly targeted, boundary scan test and function test are incompatible, and system test cannot be realized, and can be served as a general development platform. The invention also discloses the test method of the boundary scan digital circuit test method based on the PXI bus.

Description

technical field [0001] The invention relates to a test system and a test method thereof, in particular to a PXI bus-based boundary scan digital circuit test system and a test method thereof. Background technique [0002] With the rapid development of electronic technology, the proportion of digital circuits in various fields such as communication, military, industry, and medical treatment is also increasing. With the development of digital circuits, chip packaging technology is constantly developing towards high integration, high performance, multi-lead and fine pitch. The application of surface mount device (SMD), multi-chip module (MCM), multilayer printed board (MPCB) and other technologies in the circuit system has continuously increased the device mounting density. All these changes have brought about the improvement of system integration and the reduction of physical size. At the same time, the distance between nodes that can be tested is also getting smaller and smal...

AI Technical Summary

Problems solved by technology

[0003] Boundary scan technology has not been used for testing equipment for a long time. The boundary scan test bench that appeared on the market before has a single interface and cannot be compatible with functional testing. It does not have high-speed interface testing functions, system testing functions, and does not have optical fiber testing functions.

Images