Simple boundary scan test system and method based on single-chip microcomputer

Abstract

The invention discloses a simple boundary scan test system based on a single-chip microcomputer. The simple boundary scan test system comprises a control platform, a USB-to-serial port conversion circuit and a JTAG control circuit, wherein the control platform is used for transmitting TMS signals and TCK signals to a tested chip, controlling the tested chip to enter the corresponding working state, and receiving TDO signals output by the tested chip; the USB-to-serial-port conversion circuit is used for receiving USB bus signals output by the control platform, converting the USB bus signals into TMS signals and TCK signals in the serial data format and outputting the TMS signals and the TCK signals to the JTAG control circuit and also used for receiving TDO signals in the serial data format output by the JTAG control circuit, converting the TDO signals into the USB bus signals and outputting the USB bus signals to the control platform; the JTAG control circuit is used for receiving TDO signals output by the tested chip and outputting the TDO signals to the USB-to-serial port conversion circuit. The boundary scan test system is simple in structure and low in cost; the control platform of the system is independently developed, and thus the system is good in safety, and function extension is convenient to perform; the system is good in universality.

Description

Technical field [0001] The invention belongs to the technical field of circuit fault detection, and more specifically, relates to a simple boundary scan test system and a test method based on a single-chip microcomputer, which are used for fault detection of highly integrated circuits in modern equipment and equipment. Background technique [0002] Boundary scan technology is a new type of testing technology proposed for the testability design of large-scale integrated circuits, which can obtain the test information of electronic devices such as ultra-large integrated circuits and solve their testing problems. It can be used not only to test the hardware failure of a single chip, but also to test the interconnection of the circuit board. Although experts in the testing industry and some electronic equipment manufacturers in China have recognized the importance of boundary scan technology, my country's application of boundary scan technology started late and lags behind developed ...

AI Technical Summary

Problems solved by technology

[0005] In order to solve the high-cost investment and safety problems of high-integration circuit detection in equipment, the purpose of the present invention is to provide a bou

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