In situ microscopic Raman characterization system

A Raman characterization, in situ technology, applied in the field of material preparation and spectral analysis, can solve problems such as difficulty in Raman characterization

Inactive Publication Date: 2012-12-12
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, the small size of graphene sheets brings certain difficulties to its Raman characterization. How to judge whether the graphene sheets used are completely intercalated into first-order intercalation compounds is an urgent problem to be solved.

Method used

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  • In situ microscopic Raman characterization system
  • In situ microscopic Raman characterization system
  • In situ microscopic Raman characterization system

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0035] The preparation method of this graphene sheet intercalation compound provided by the present invention is to place the graphene sheet in a cuvette connected and communicated with the glass tube; place ferric chloride in the glass tube; Vacuum the tube and cuvette; heat and seal the glass tube with an alcohol lamp; heat the glass tube and cuvette to 340 degrees Celsius and keep it for 6 to 24 hours; then cool down to room temperature.

[0036] Among them, if the ferric chloride is wet, use a molecular pump to evacuate the glass tube and cuvette, heat it to 100 degrees Celsius with a heating platform and keep it for 1 hour. After cooling, heat and seal the glass tube with an alcohol lamp.

[0037] see figure 1 as sh...

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Abstract

The invention discloses an in situ microscopic Raman characterization system which comprises: a glass tube and a colorimetric ware, which respectively contain ferric trichloride and graphene flakes and are hermetically communicated with each other; a laser; a Raman spectrometer; a heating table; a lifting platform; a translation stage; and two vibrating mirrors. The in situ microscopic Raman characterization system provided by the invention can be used for in situ characterization of microscopic Raman spectrum of a graphene flake / ferric trichloride intercalation compound and is capable of in situ monitoring of the formation situation of the graphene flake / ferric trichloride intercalation compound.

Description

[0001] This application is a divisional application, the application number of the parent application: 201110059829.5, the application date: March 11, 2011, the name: the preparation method of graphene sheet intercalation compound and the in-situ micro-Raman characterization system. technical field [0002] The invention relates to the technical fields of material preparation and spectral analysis, in particular to an in-situ micro-Raman characterization system. Background technique [0003] Graphite intercalation compound is a compound that inserts atomic or molecular layers between the graphene layers of graphite. Due to their unique features in terms of structure, electrical and optical properties, graphite intercalation compounds have been extensively studied since their discovery in 1841. They are widely used in electrodes, conductors, superconductors, catalysts, batteries and other fields. [0004] The recent discovery and physical research of graphene won the Nobel P...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65
Inventor 谭平恒赵伟杰韩文鹏历巧巧姬扬
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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