9 results about "Micro raman spectroscopy" patented technology

The utility model provides a confocal microscopic Raman spectrometer wave number correction device, and belongs to the technical field of Raman spectrum detection. The correction device comprises a laser used for emitting laser; the lens assembly comprises a plurality of lenses, and the lens assembly is used for collimating and focusing the laser; the reflector assembly comprises a plurality of reflectors, the plurality of lenses and the plurality of reflectors are alternately arranged, and the reflector assembly is used for adjusting the light path direction of the laser; the attenuation sheet is arranged on a reflection light path in the reflector assembly and is used for attenuating the energy of the laser; the slit is arranged at a confocal position in the lens assembly, and the slit is used for screening Rayleigh scattering light in the attenuated laser; wherein the reflector assembly reflects the Rayleigh scattering light to the rotating grating assembly in the spectrometer. The correction device realizes a convenient and fast calibration process, and improves the calibration precision.

The application discloses a kind of in-situ micro electric field multifunctional probe test auxiliary device.The device includes hexagonal box body, U-shaped probe baffle and main base;Each side wall of the hexagonal box body is provided with U-shaped window;The U-shaped probe baffle is inserted into the U-shaped window;A pair of sealing sheets is provided on each U-shaped probe baffle, and the gap formed at the abutting place thereof is used as the entrance and exit of the probe;An objective lens sealing sliding element is provided on the top cover of the hexagonal box body, and the objective lens can move vertically through the central hole of the objective lens sealing sliding element;The hexagonal box body, U-shaped probe baffle, objective lens sealing sliding element and objective lens form a sealed cavity.The device can realize multiple probes to prick in micron scale sample at any position to apply voltage or current, and after being used with a microscopic Raman spectrometer, the sample can be in-situ collected Raman spectrum, and the microstructure change is analyzed.

The invention relates to the technical field of food quality detection, in particular to a green tea variety and producing area identification method based on multi-solvent fusion surface enhanced Raman spectroscopy, which comprises the following steps: crushing and sieving a green tea sample, adding ultrapure water, absolute ethyl alcohol or hydrochloric acid solution, oscillating and extracting, centrifuging, and reserving supernate; mixing the supernate with the silver nanoparticle suspension, performing ultrasonic treatment, dripping on a silicon wafer, drying, acquiring spectrums at three positions by adopting a laser confocal microscopic Raman spectrometer, and performing baseline correction to obtain an average spectrum, thereby obtaining a surface enhanced Raman scattering spectrum; carrying out data fusion on the surface enhanced Raman scattering spectrum through matrix splicing, CARS, PCA, t-SNE and UMAP; according to the method, the fusion spectrum is divided into a training set and a test set, an identification model is constructed by adopting SVM, KNN and RF, green tea variety classification and origin traceability are realized, spectrum data are processed from the aspects of complete information retention, feature screening, linear dimensionality reduction, local structure retention and multi-scale structure retention, and the classification accuracy reaches 98.21%.

The application discloses a confocal microscopic Raman spectrum optical defect detection system and relates to the technical field of Raman spectrum analysis. Two filtering methods are used. One is to control the micro area scanning position of the system by using the microscopic confocal technology and filter out the scattered light signals of non-focal areas. The other is to filter out the strong reflected light and background stray light by using the property of Raman scattering light frequency change. Finally, the Raman spectrum change conditions of different positions of the sample are analyzed, and the surface defects are indirectly characterized. The scanning galvanometer is used to control the light beam, the speed is high, the control precision is high, and the problem of rapid detection of large-aperture optical elements is solved.

This invention provides a multimodal microscopic imaging integrated detection system, relating to the field of microscopic optical detection technology. It includes a bright-field microscopic imaging module sharing a tissue section sampling optical path assembly, and at least two of three modules: a polarized light microscopic imaging module, a fluorescence microscopic imaging module, and a micro-Raman spectroscopy detection module. The bright-field, polarized light, and fluorescence microscopic imaging modules share an imaging optical path assembly. The micro-Raman spectroscopy detection module includes a Raman spectrometer and a laser for irradiating tissue sections to excite Raman scattering light. The beneficial effect of this invention is that, based on bright-field microscopic imaging, it introduces multiple characteristic imaging or spectroscopic technologies such as polarized light imaging, fluorescence imaging, and Raman spectroscopy. Through multimodal information complementarity, it enriches the differential information between cancerous tissues and normal, inflammatory lesions, etc., significantly improving the speed and efficiency of pathological examination and enabling rapid and accurate intraoperative cancer diagnosis.

The invention discloses a cause analysis method for annulus pyrite, and relates to the technical field of mineral analys.The method comprises the following steps that a sample is cut into sheets, and an annulus pyrite area to be detected is selected; grinding the surface of the to-be-detected belt pyrite step by step, and then performing fine polishing by using a diamond suspension and a colloidal silicon dioxide polishing solution to obtain a polished section; a laser confocal microscopic Raman spectrometer is used for carrying out surface scanning on the optical sheet to collect a Raman spectrum, and then dotting scanning is carried out according to a trans-annulus interface of the annulus pyrite from the inside to the outside of the nucleus; carrying out surface scanning and dotting analysis on the same area by adopting an electronic probe; the evolution process of the annulus corpus luteum ore is analyzed by combining a Raman spectrum and an electronic probe result, and verification is carried out by combining sulfur isotope data. According to the method, element introduction interference in the sample preparation process is eliminated, electronic probe analysis and Raman spectrum combined analysis are adopted, the causes of pyrite are analyzed from multiple dimensions, and the accuracy of the analysis result is remarkably improved.

According to some embodiments, a micro-Raman spectrometer includes a stage configured to hold a sample on a surface of which a fluorescent material is applied. The micro-Raman spectrometer includes a laser optical system configured to irradiate the sample with laser light. The micro-Raman spectrometer includes a Raman scattered light detector configured to detect Raman scattered light emitted from the sample. The micro-Raman spectrometer includes a fluorescence detector configured to detect fluorescence emitted from the fluorescent material. The micro-Raman spectrometer includes an analyzer configured to analyze a Raman signal of the Raman scattered light detector and a fluorescence signal of the fluorescence detector. The micro-Raman spectrometer includes a controller connected to the analyzer and configured to control the stage and the laser optical system.

Microscopic Raman spectroscopy device that detects and analyzes Raman scattering light emitted from sample irradiated with excitation light includes: laser light source that emits excitation light; spectrometer for measuring spectrum of the Raman scattering light; wavelength discriminator such as a dichroic filter that reflects the excitation light emitted from the laser light source toward the sample and transmits Raman scattering light emitted from the sample toward the spectrometer; condenser lens arranged between wavelength discriminator and the spectrometer for condensing the Raman scattering light passing through the wavelength discriminator; aperture arranged between the condenser lens and the spectrometer for limiting Raman scattering light incident on the spectrometer; adjusting means for adjusting to match a position of spot image of Raman scattering light condensed by condensing lens with a position of the aperture so that light amount of Raman scattering light passing through the aperture is maximized.

A micro-Raman apparatus (100) comprises a light source unit (110), an objective lens unit (140), a detection device (160), a drive device (180), and a control device (200) for controlling the drive device (180). The light source unit (110) includes a plurality of light source devices (111-114) configured so as to generate mutually different wavelengths of light. The objective lens unit (140) condenses and radiates light from the light source unit (110) to a sample (SMP) to be analyzed. The detection device (160) detects Raman scattered light generated from the sample (SMP). The drive device (180) changes a relative distance between the sample (SMP) and the objective lens unit (140). The control device (200) is configured so as to correct the relative distance in accordance with the wavelength of light radiated from the light source device that is used.