10 results about "Electrical aging" patented technology

This invention discloses a method, apparatus, electronic device, and storage medium for preparing cross-linked ethylene copolymer AC cables, belonging to the field of cable parameter design. The method includes: obtaining the electrical aging time and first breakdown field strength of a cable sample under different voltages, and calculating the electrical aging coefficient; obtaining the thermal aging time of the cable sample at different thermal aging temperatures, where the breakdown field strength drops to a preset proportion of the initial breakdown field strength, and calculating the thermal aging coefficient; obtaining the power frequency breakdown voltage of the cable sample under a power frequency breakdown test, and calculating the thickness coefficient; obtaining the second breakdown field strength of the cable sample under a power frequency breakdown test, and calculating the safety factor; and calculating the insulation thickness of the cable to be prepared based on the electrical aging coefficient, thermal aging coefficient, thickness coefficient, and safety factor, and preparing the corresponding cross-linked ethylene copolymer AC cable. Therefore, by implementing this invention, the problem that the insulation thickness design in the prior art cannot achieve the optimal performance of the cable can be solved.

This invention relates to the field of aluminum electrolytic capacitor production technology and discloses a static charging aging machine for aluminum electrolytic capacitors. The static charging aging machine includes a frame, on which are mounted a connector insertion machine, a palletizer, a storage aging chamber unit, and a discharge sorting machine. The palletizer is located between the discharge sorting machine and the connector insertion machine. The palletizer's working stroke covers the entire length of the connector insertion machine's discharge end, all chambers of the storage aging chamber unit, and the discharge sorting machine's feed end. The storage aging chamber unit includes a normal temperature charging chamber, a high temperature charging chamber, and a static cooling chamber arranged sequentially along the material flow direction. The normal temperature charging chamber, high temperature charging chamber, and static cooling chamber are all independently and fixedly installed on the frame between the connector insertion machine and the discharge sorting machine. An industrial control unit is also mounted on the frame.

The present application relates to the technical field of electrical sensing detection, in particular to a screen electrical aging detection method based on DC impedance drift monitoring. The specific implementation process includes: using an electrical impedance sensor to apply a detection pulse and collect impedance response, constructing an initial impedance base map to form an impedance response curve; calculating impedance drift amount and drift rate to locate dielectric relaxation decay area, extracting impedance mutation boundary to identify aging characteristics; conducting spatial diffusion analysis on the impedance mutation boundary to distinguish between gate insulating layer aging and liquid crystal contamination aging; estimating the remaining reliable life of the screen according to the aging category, and forming a self-verification aging archive. The present application combines the spatial evolution of electrical characteristics with the physical wiring or backlight heat distribution characteristics of the panel by using DC impedance drift monitoring and spatial distribution analysis technology, realizes the detection and classification of screen electrical aging, and improves the efficiency and traceability of screen aging management through life integration and register write-back mechanism.

The present application discloses a chip-embedded package. The chip-embedded package comprises a base circuit board, a chip unit, a plastic packaging layer, and a plurality of connecting members; the chip unit is fixedly mounted in a corresponding mounting slot, and the chip unit comprises a metal substrate and a chip; a step having a first surface and a second surface is formed on the metal substrate, and the chip is fixedly connected to the second surface; the first surface protrudes from the second surface, and the second surface extends to at least one side edge of the metal substrate; one end of each connecting member is correspondingly connected to the chip, and the other end of the connecting member extends to a first side of the plastic packaging layer so as to be exposed; the connecting members include a first connecting member, one end of the first connecting member is connected to a first side of the chip, and the other end of the first connecting member crosses the second surface to horizontally extend to a first side of the base circuit board and extend to the edge of a board so as to be exposed. By means of the described arrangement, the present application can reduce the risk of electrical aging and insulation failure of the chip-embedded package.

The utility model provides a multifunctional electric aging protection device, comprising a shell temperature detection unit which is composed of a thermocouple sensor and a heat conduction structure and is used for collecting the shell temperature of an electronic component in real time and converting the shell temperature into an electric signal; the voltage and current detection unit comprises a voltage transformer, a current transformer and a signal adjusting circuit and is used for sampling and processing voltage and current signals; the central control unit is used for receiving the signals and judging whether an overvoltage, overcurrent or overtemperature threshold value is triggered or not; the power-off protection unit comprises a relay, is connected in series with a power supply loop and is used for responding to instructions of the central control unit to cut off the circuit; and the communication unit is used for bidirectionally transmitting data with an upper computer through an RS485 module. By integrating the functions of shell temperature detection, voltage and current monitoring, intelligent power-off and remote communication, the problems of protection blind spots and data islands in the aging test of electronic components are solved.

This invention relates to the technical field of valve electric actuator testing equipment. A valve electric actuator aging test bench includes an operating platform with an integrated controller. A control panel is fixedly connected to the operating platform, comprising an air switch, an emergency stop switch, and a power switch. A control interface is installed on the operating platform, and a protective door is hinged to it. Support legs are fixedly connected to the lower surface of the operating platform. A changing device for adjusting the workpiece position is provided on the operating platform. The changing device includes a base positioned above the operating platform, and a connector plugging / unplugging device is provided on the base. This valve electric actuator aging test bench effectively solves the problem that repeated power outages cause drift in the power supply and signal acquisition reference parameters of the test circuit, further reducing the accuracy and reliability of electrical aging test data.

This application discloses a composition, an optoelectronic device, and a display device. The composition includes a semiconductor material and a first metal salt. The first metal salt includes a first metal element having at least two valence states, including a first valence state and a second valence state, wherein the first valence state is higher than the second valence state. The valence state of the first metal element in the first metal salt is the first valence state. The semiconductor material includes one or more of N-type metal oxides, P-type metal oxides, P-type organic compounds, and quantum dots. The first metal salt can act as a redox agent, effectively improving the phenomenon of semiconductor material being oxidized by activated oxygen, thereby improving the performance stability of the semiconductor material. The composition can be applied to optoelectronic devices, effectively improving the problem of aging and degradation of functional layers due to oxidation by activated oxygen, improving the electrical aging stability of optoelectronic devices, thereby improving the device life and reliability of optoelectronic devices.

This invention proposes an SMD crystal oscillator electrical aging device, comprising a test chamber and a steam component. The test chamber contains a capsule-type housing module and a sealing cover. A cylinder is installed on the test chamber to drive the sealing cover towards or away from the capsule-type housing module. An air supply component is installed on the back of the test chamber to supply air into the capsule-type housing module. The steam component is used to guide steam into the test chamber and the steam component. This invention provides an SMD crystal oscillator electrical aging device that simulates the sealed working environment of the crystal oscillator using the capsule-type housing module and the sealing cover. The size of the capsule is adjusted and sealed using the air supply component and the tubular shunt component to closely approximate the real-world condition. Steam is guided into the test chamber through the first air pipe of the steam component to simulate a humid and hot environment, overcoming the shortcomings of traditional methods. Steam is then introduced into the sealing cover through the second air pipe, directly contacting the crystal oscillator to enhance the testing effect and accurately assess its reliability under harsh environments.

The present application relates to the technical field of electrical aging, in particular to a time sequence data analysis method for metering box component aging; time sequence data of electrical load, local temperature, surface leakage current and external weather of multiple space nodes in the metering box is obtained; based on the physical topology position of the space node, the electrical load time sequence data and the local temperature time sequence data are constructed into a multi-node three-dimensional space-time tensor; the multi-node three-dimensional space-time tensor is input into a graph attention network, a dynamic heat transfer weight matrix is identified, and the mixed heat of the space node is decoupled into an independent heating sequence and a heat cross-talk sequence; the independent heating sequence and the heat cross-talk sequence are used as a composite heat source excitation to reconstruct the solid temperature sequence of the insulating surface of each space node; based on the dynamic dew point, the surface condensation time sequence is obtained in combination with the solid temperature sequence; the surface condensation time sequence and the surface leakage current time sequence are fused and mapped to identify the insulation aging cumulative index, and a dynamic peak shaving and load shedding instruction is sent.

A LNG transport ship super-low-temperature cable life evaluation method, system and equipment, comprising: obtaining working condition data of cable samples, performing multiple cable step-by-step voltage boosting breakdown tests, obtaining the last stage pressure duration and breakdown voltage of each test, and calculating the life index of the cable samples; a voltage duration equivalent model is established, and the electrical aging test parameters are calculated through the working voltage, the annual working duration and the life index; a temperature cycle screening degree model is established, and the thermal mechanical aging test parameters are calculated according to the environmental temperature change data; a set number of cable samples are aged based on the electrical aging test parameters and the thermal mechanical aging test parameters, and whether the insulation resistance of each cable sample is greater than the set resistance threshold is judged and detected multiple times to verify whether the service life of the cable meets the requirements. The present application can quickly and accurately evaluate the life of the LNG transport ship super-low-temperature cable under complex and extreme working conditions.