48 results about "Electrical aging" patented technology

The invention discloses a rapid equalizing charging method for a lithium ion battery pack, and belongs to the field of battery charging. The method comprises the following steps: step 1, establishing a first-order enhanced equivalent circuit model, constructing an aging model in combination with an Arrhenius equation, and comprehensively establishing an electric heating aging fusion model; 2, constructing a battery pack model through series connection based on a single battery model of the electrothermal aging fusion model; 3, configuring a deep reinforcement learning environment on the basis of the electrothermal aging coupling model, wherein the deep reinforcement learning environment is used for simulating the real state of interaction between a deep deterministic policy gradient algorithm (DDPG) and the battery pack in deep reinforcement learning; 4, a deep reinforcement learning Actor network, a Critic network and a reward function are constructed, and the target of the reward function is defined as the shortest charging time of the battery pack, SOC (state of charge) balance and minimum aging loss so as to support operation and result evaluation of a DDPG algorithm; and 5, training the model to obtain the optimal fast equalization charging current.

The invention relates to a high-heat-resistance and high-insulation two-component epoxy resin adhesive and application thereof, and belongs to the technical field of epoxy resin. The technical problem to be solved by the invention is to provide the high-heat-resistance and high-insulation two-component epoxy resin adhesive. The adhesive comprises a component A and a component B. The component A comprises bisphenol A epoxy resin, novolac epoxy resin, silicon carbide whiskers, potassium titanate fibers, boron phenolic resin and modified nano boron nitride. The component B is prepared from methylhexahydrophthalic anhydride, methyl tetrahydrophthalic anhydride, 2-phenylimidazole, modified aluminum oxide, polyimide micro powder and modified wollastonite. Through synergism of multiple materials, balance of heat conduction, insulation, mechanical strength and thermal stability of the adhesive is realized. Under high-frequency pulse voltage, the adhesive is long in electrical aging life. A gradient curing process is adopted for curing, complete reaction in each stage is guaranteed, and internal stress is reduced. The process fault tolerance is high, the environment compatibility is high, the cost is low, and the curing time is short.

The invention relates to a cable insulation aging evaluation method and device and a medium, and belongs to the technical field of electrical insulation, and the method comprises the following steps: obtaining the operation data of a cable, and obtaining a thermal aging factor, an electrical aging factor, a mechanical stress factor and a humidity influence factor according to the environment temperature, the electric field intensity, the mechanical stress and the relative humidity of the cable; and calculating the comprehensive aging index of the cable based on the factors. And inputting the operation data and the comprehensive aging index into the TCN-LSTM model, and outputting an insulation aging score of the cable. According to the method, various factors such as the environment temperature, the electric field intensity, the mechanical stress and the relative humidity are comprehensively considered, evaluation errors caused by only considering a single factor are avoided, the more comprehensive and accurate cable comprehensive aging index can be obtained, the cable insulation aging degree can be evaluated more accurately, and a reliable basis is provided for cable maintenance decision making.

The invention belongs to the technical field of epoxy material aging evaluation methods, particularly relates to a joint evaluation characterization method for aging characteristics of an epoxy insulating material, and aims to solve the problems that in the prior art, a method for simultaneously carrying out comprehensive evaluation on aging of epoxy resin on thermal, electromagnetic and mechanical property changes is lacked, and most of existing methods adopt simple threshold comparison. And the accuracy and objectivity of an evaluation result are limited. The characterization method comprises the following steps: providing an epoxy insulating material sample; comprehensive aging treatment of electrical aging, thermal aging and mechanical aging is applied to the epoxy insulating material sample so as to obtain epoxy insulating material samples aged at different time lengths; respectively measuring a thermal performance parameter, an electromagnetic performance parameter and a mechanical performance parameter corresponding to each aging time length; and inputting the obtained performance parameters into the neural network model, and outputting the aging grade and the aging factor of the epoxy insulating material so as to complete the joint evaluation of the aging characteristics of the epoxy insulating material.

The invention relates to an electric-thermal combined aging simulation system and an aging simulation method of oiled paper. The system comprises an aging oven, a sealing oil groove arranged in the aging oven, and an electrode module and a temperature control module which are arranged in the sealing oil groove, the sealed oil groove is filled with insulating oil, the electrode module comprises an upper electrode and a lower electrode parallel to the upper electrode, and an oil paper sample is placed between the upper electrode and the lower electrode; the electrode module is used for applying an electric field to the surface of the oiled paper sample to simulate the electrical aging process of the oiled paper sample; and the temperature control module is used for adjusting the temperature of the insulating oil in the sealed oil groove in the process of simulating the electrical aging of the oiled paper sample so as to simulate the process of the combined action of thermal aging and electrical aging of the oiled paper sample. By adopting the method, accurate control of electric-thermal aging can be realized.

This invention discloses a method, apparatus, electronic device, and storage medium for preparing cross-linked ethylene copolymer AC cables, belonging to the field of cable parameter design. The method includes: obtaining the electrical aging time and first breakdown field strength of a cable sample under different voltages, and calculating the electrical aging coefficient; obtaining the thermal aging time of the cable sample at different thermal aging temperatures, where the breakdown field strength drops to a preset proportion of the initial breakdown field strength, and calculating the thermal aging coefficient; obtaining the power frequency breakdown voltage of the cable sample under a power frequency breakdown test, and calculating the thickness coefficient; obtaining the second breakdown field strength of the cable sample under a power frequency breakdown test, and calculating the safety factor; and calculating the insulation thickness of the cable to be prepared based on the electrical aging coefficient, thermal aging coefficient, thickness coefficient, and safety factor, and preparing the corresponding cross-linked ethylene copolymer AC cable. Therefore, by implementing this invention, the problem that the insulation thickness design in the prior art cannot achieve the optimal performance of the cable can be solved.

The utility model discloses a chip embedded type printed circuit board, which comprises a target circuit board, at least one chip unit, a heat dissipation device and a plastic package layer, and is characterized in that the chip unit is fixedly mounted in a mounting groove of the target circuit board and comprises at least one metal substrate and at least one chip; the chips and the corresponding metal substrates are fixedly arranged, and the chips are connected with the metal substrates; the heat dissipation device is attached to the second side of the target circuit board, and the heat dissipation device comprises an insulating plate and a radiator; wherein the target circuit board is provided with a plurality of connection networks, the connection networks comprise a plurality of first connection networks and a plurality of second connection networks, and the minimum distance between each second connection network and other connection networks is larger than 0.3 mm. Through the above mode, the electric aging insulation failure risk of the chip embedded type printed circuit board can be reduced.

The invention discloses a screening method for early display of electrical badness of a thin film transistor display panel, and relates to the technical field of display panel inspection, in particular to the screening method for early display of electrical badness of the thin film transistor display panel, which comprises the following steps: applying an electrical signal to each circuit layer electrode of the TFT panel through an array generator; applying a signal to the panel by using a Probe structural body, or moving the Probe structural body to a position above each unit panel through a Stage structural body; electrical aging is performed on a panel active region and a GOA loop part, so that potential defects caused by foreign matters or abnormal characteristics of an insulating film are exposed as actual electrical defects in advance. According to the method, the badness is identified and positioned by monitoring the variation of resistance, voltage, current and the like, and an optical instrument can be adopted for accurate positioning. The Probe structural body can adapt to various contact terminals according to the characteristics of the bonding pad, and the Stage structural body can move accurately. According to the method, potential defects can be effectively screened, and the panel yield is improved.

The utility model provides a drying oven and a drying oven tray of capacitor and lithium battery aging equipment, the drying oven comprises a chain conveying mechanism, an aging station and a plurality of drying oven trays, each drying oven tray is provided with an aging monitoring module, a wireless communication module and a special feeding strip frame, the tail end of each special feeding strip frame is provided with a wire connected with the aging detection module, an electric brush is adopted for continuously supplying power to the drying oven tray, and the aging monitoring module monitors the material aging process and transmits data to the upper computer to judge the quality of materials. According to the utility model, the real-time monitoring of the automatic aging process of the material is realized, and the advantages of high automation degree and high production efficiency of dynamic aging and continuous power supply and whole-process monitoring of static aging are fully integrated.

The invention belongs to the field of testing, and particularly relates to a simple evaluation method and system based on the insulation aging state of a multi-stress polypropylene cable. Evaluating by adopting a comprehensive aging index, wherein the comprehensive aging index is calculated by adopting the following formula; wherein CAI is a comprehensive aging index, alpha T is a thermal aging stress item, alpha E is an electrical aging stress item, alpha RH is a humidity aging stress item, and alpha epsilon is a mechanical aging stress item. According to the evaluation means, the aging state can be quickly evaluated, and the early warning accuracy is improved.

The invention relates to a multi-channel withstand voltage test system and method for an insulating material. The system comprises a control unit and a test unit, and the control unit comprises a signal output module used for sending a first control instruction to the test unit; the signal acquisition module is used for receiving the state monitoring signals of each test channel acquired by the test unit in the withstand voltage test process, the state monitoring signals comprise current signals, and the signal acquisition module is used for analyzing the electrical aging process and breakdown characteristics of each insulating material sample in the withstand voltage test process; the test unit comprises a high-voltage switch module which is used for responding to the first control instruction to control and open a test channel corresponding to the high-voltage switch module, so as to execute the withstand voltage test of the insulating material sample in the test channel. According to the embodiment of the invention, the multi-channel parallel voltage withstanding test can be realized, the test efficiency is remarkably improved, and behavior monitoring and full life cycle performance backtracking of the insulating material in the voltage withstanding process can be realized.

The invention provides a piezoelectric driving device aging device. The piezoelectric driving device aging device comprises a device clamp, a pressurizing piece and an electrifying assembly, and can realize comprehensive aging test on a piezoelectric driving device under a multi-stress coupling condition. The device clamp comprises a fixed part and a movable part, the piezoelectric driving device is clamped between the fixed part and the movable part, the moving direction of the movable part is consistent with the actual working displacement direction of the piezoelectric driving device, and it is ensured that the mechanical loading direction conforms to the actual stress working condition of the device in the testing process. The pressurizing piece specifically adopts an existing press machine, the output end of the pressurizing piece is in direct driving connection with the movable piece, loading pressure on the piezoelectric driving piece can be adjusted and kept in real time through the controller, and mechanical aging tests under different pressure conditions are achieved. The electrifying assembly comprises a movable electrode and an electrode driving piece, the movable electrode is controlled by displacement of the electrode driving piece to achieve controllable contact and separation with the piezoelectric driving piece electrode, and the electrical aging test is completed while reliable electrical connection is ensured.

The invention discloses a multi-parameter coupling and non-electric aging dominant equipment state defining system and method, and relates to the technical field of electric power operation and maintenance, and the defining system is composed of a multi-dimensional aging characteristic parameter acquisition unit, a simulation test calculation analysis unit, a comprehensive evaluation unit and an aging dominant type defining unit. The multi-dimensional aging characteristic parameter acquisition unit is used for acquiring and storing physical parameters of thermal, electrical, mechanical and environmental aging dimensions of equipment; the simulation test calculation and analysis unit is used for acquiring degradation parameters of an equipment material level by utilizing multi-physics field coupling simulation and accelerated aging test; and the aging dominant type defining unit is used for generating an equipment state label according to the received equipment aging state level. According to the multi-parameter coupling and non-electric aging dominant equipment state defining system and method, multi-dimensional characteristic parameters are fused, the aging dominant degree is scientifically quantified, and important technical support is provided for risk prevention and control and service life extension strategy formulation of open old equipment.

The utility model relates to a super capacitor module charging and discharging aging test tool, which comprises a test base and a console, a plurality of test stations are arranged on the top surface of the test base, an input volt-ammeter, an output volt-ammeter and a test interface are arranged on each test station, and a plurality of indicating lamps corresponding to the plurality of test stations are arranged on the top surface of the console. A test circuit board corresponding to each test station is arranged in the test base, a timer is arranged on the test circuit board, and the timer, the input volt-ammeter, the output volt-ammeter and the test interface are electrically connected with the test circuit board. According to the utility model, when the aging test of a plurality of super capacitor modules is carried out, the plurality of super capacitor modules are inserted on the test stations of the test base, then the super capacitor module aging test device continuously carries out charging and discharging operations on the super capacitor modules, and defective products can be screened out after the aging test is carried out. The testing tool has the advantages of high testing speed, batch testing, low cost and the like.

The invention belongs to the technical field of dimming film testing, and particularly relates to a power-on aging oven for a dimming film, which comprises an aging test box body, a temperature and humidity control box is installed on the right side face in the aging test box body, a control assembly is installed on the front face of the temperature and humidity control box, a sealing door is hinged to the front face of the aging test box body, and transparent observation windows are installed on the side face of the aging test box body and in the sealing door; according to the invention, the rear end of the electrode plate is forced to naturally suspend and tilt by using the lever principle, so that the electrode plate is smoothly guided to be inserted into the bayonet of the jointing clamp, then the jointing clamp tightly clamps the upper and lower sides of the electrode plate, and the clamping mode of multi-point contact is strong in locking force; the phenomena of contact resistance fluctuation and open circuit caused by equipment vibration or electrode displacement are effectively avoided, and the electrical connection stability of the dimming film in the power-on aging process is remarkably improved, so that the accuracy and reliability of test data are ensured.

The invention relates to the technical field of chip manufacturing, a detection card is prepared based on a manufacturing method provided by the invention, the detection card comprises a probe, an elastic piece, a non-conductive probe guiding plate, a probe stabilizing plate and a top plate, the probe guiding plate is made of a transparent non-conductive material, so that the probe is conveniently aligned with an electrode on a chip, the probe stabilizing plate limits the probe, the probe is prevented from moving to scratch the chip, and the detection efficiency is improved. The elastic piece compensates for the distance difference between the probe and the electrode caused by the probe length error and the electrode thickness error, and stable contact between the probe and the electrode is guaranteed. The prepared probe card is applied to the chip manufacturing process, defective chips are detected, before the substrates are cut, the large whole substrates are electrified for aging detection, the defective chips are sorted out and are correspondingly removed during cutting, and the shipment defective product rate is reduced. A plurality of chips are simultaneously detected at one time, the workload is reduced, the time is saved, compared with aging detection after packaging, the method is simple, the overall process period is greatly shortened, and the cost is reduced.

The application discloses a chip embedded package, which comprises a base circuit board, a chip unit, a plastic sealing layer and a plurality of connecting pieces. The chip unit is fixedly installed in a corresponding installation groove, and comprises a metal substrate and a chip. A step with a first surface and a second surface is formed on the metal substrate, and the chip is fixedly connected with the second surface. The first surface protrudes from the second surface, and the second surface extends to at least one side edge of the metal substrate. One end of each connecting piece is connected with the chip correspondingly, and the other end of each connecting piece extends to a first side of the plastic sealing layer and is exposed. The connecting piece comprises a first connecting piece, one end of which is connected with a first side of the chip, and the other end of which extends to the first side of the base circuit board horizontally across the second surface and is exposed to the edge of the board. In this way, the application can reduce the risk of electrical aging insulation failure of the chip embedded package.

The application discloses a relay state diagnosis method, and relates to the technical field of data analysis, and comprises the following steps: setting test parameters, testing the relay, obtaining test results, obtaining the contact aging degree and the electrical aging degree through first analysis, obtaining the comprehensive aging degree of the relay through fusion, and dividing the relay state grade. The application simultaneously considers the contact aging and the electrical aging, comprehensively reflects the actual state of the relay, accurately evaluates the comprehensive aging degree of the relay, formulates a more accurate maintenance strategy, and avoids resource waste caused by excessive maintenance or delayed maintenance. Precise diagnosis ensures that maintenance work is carried out when necessary, prolongs the service life of the relay, reduces equipment replacement cost, fully utilizes different types of data information by fusing the contact aging and electrical aging data, improves the anti-interference ability of the diagnosis result, and enhances the reliability of the diagnosis result.

The utility model discloses a motor off-line aging test frame device, which comprises a base, and a plurality of test stations are arranged at the top of the base along a first direction. And a fixed pressing block, a motor driving module and a safety monitoring module are sequentially arranged in each test station in the second direction. The fixing pressing block is used for fixing a first to-be-tested motor and a second to-be-tested motor, the motor driving module comprises a first driving module and a second driving module which are in signal connection with the first to-be-tested motor and the second to-be-tested motor respectively, and the safety monitoring module is used for conducting power-on aging monitoring on the first to-be-tested motor and the second to-be-tested motor. The first to-be-tested motor and the second to-be-tested motor are fixed through the fixed pressing block, it is ensured that the motors cannot shift due to vibration or external force in the testing process, various performance data of the motors can be monitored and recorded through the safety monitoring module, and manual intervention is reduced.

This invention relates to the field of aluminum electrolytic capacitor production technology and discloses a static charging aging machine for aluminum electrolytic capacitors. The static charging aging machine includes a frame, on which are mounted a connector insertion machine, a palletizer, a storage aging chamber unit, and a discharge sorting machine. The palletizer is located between the discharge sorting machine and the connector insertion machine. The palletizer's working stroke covers the entire length of the connector insertion machine's discharge end, all chambers of the storage aging chamber unit, and the discharge sorting machine's feed end. The storage aging chamber unit includes a normal temperature charging chamber, a high temperature charging chamber, and a static cooling chamber arranged sequentially along the material flow direction. The normal temperature charging chamber, high temperature charging chamber, and static cooling chamber are all independently and fixedly installed on the frame between the connector insertion machine and the discharge sorting machine. An industrial control unit is also mounted on the frame.

The present application relates to the technical field of electrical sensing detection, in particular to a screen electrical aging detection method based on DC impedance drift monitoring. The specific implementation process includes: using an electrical impedance sensor to apply a detection pulse and collect impedance response, constructing an initial impedance base map to form an impedance response curve; calculating impedance drift amount and drift rate to locate dielectric relaxation decay area, extracting impedance mutation boundary to identify aging characteristics; conducting spatial diffusion analysis on the impedance mutation boundary to distinguish between gate insulating layer aging and liquid crystal contamination aging; estimating the remaining reliable life of the screen according to the aging category, and forming a self-verification aging archive. The present application combines the spatial evolution of electrical characteristics with the physical wiring or backlight heat distribution characteristics of the panel by using DC impedance drift monitoring and spatial distribution analysis technology, realizes the detection and classification of screen electrical aging, and improves the efficiency and traceability of screen aging management through life integration and register write-back mechanism.

The present application discloses a chip-embedded package. The chip-embedded package comprises a base circuit board, a chip unit, a plastic packaging layer, and a plurality of connecting members; the chip unit is fixedly mounted in a corresponding mounting slot, and the chip unit comprises a metal substrate and a chip; a step having a first surface and a second surface is formed on the metal substrate, and the chip is fixedly connected to the second surface; the first surface protrudes from the second surface, and the second surface extends to at least one side edge of the metal substrate; one end of each connecting member is correspondingly connected to the chip, and the other end of the connecting member extends to a first side of the plastic packaging layer so as to be exposed; the connecting members include a first connecting member, one end of the first connecting member is connected to a first side of the chip, and the other end of the first connecting member crosses the second surface to horizontally extend to a first side of the base circuit board and extend to the edge of a board so as to be exposed. By means of the described arrangement, the present application can reduce the risk of electrical aging and insulation failure of the chip-embedded package.

The utility model relates to the related technical field of electrical tests, in particular to an electrical aging test early warning device which comprises a tester body, a fixing mechanism is arranged at the top of the tester body, and an adjusting mechanism is arranged at the top end of the tester body. The fixing mechanism comprises a clamping block, a side lug, a first connecting plate, a second connecting plate, an adjusting plate, a sliding groove, an adjusting bolt, a bottom plate, a first connecting bolt, a second connecting bolt, a circular groove, a fixing bolt and a mounting block. The movement of the adjusting plate drives the first connecting plate and the second connecting plate to move along the sliding grooves, then the clamping blocks are driven to move through the side lugs, the distance between the two sets of clamping blocks is changed, joints of different sizes can be fixed, the height of the joints in the testing opening can be conveniently adjusted through the adjusting mechanism, and the testing efficiency is improved. And the fixing mechanism is matched to be tightly attached to a test point at the bottom of the test opening of the tester body.

The invention discloses a preparation method of a photoelectric device, the photoelectric device and electronic equipment, and the method comprises the steps: providing a bottom electrode, and forming a functional layer at one side of the bottom electrode; a top electrode is formed on the side, away from the bottom electrode, of the functional layer, the functional layer comprises a first carrier functional layer, and the preparation method of the first carrier functional layer comprises the steps that dispersion liquid containing first metal oxide is provided, electrical aging treatment is conducted on the first metal oxide, and a first carrier functional material is obtained; depositing the first carrier function material; and drying the deposited first carrier function material to obtain the first carrier function layer, thereby being beneficial to improving the performance stability and reliability of the photoelectric device.

The invention relates to the technical field of electromagnetic measurement, and discloses an experimental method for simulating cable insulation breakdown under ocean dynamics, and the method comprises the steps: carrying out the working condition element decoupling of a target ocean, and obtaining an independent dynamic electric stress component; performing time sequence dependence construction on the independent dynamic electric stress component to obtain a composite time sequence electric loading scheme; performing electrical aging simulation on the target sample cable to obtain a dielectric parameter change track of the target sample cable; carrying out self-adaptive reconstruction on the loading sequence of the composite time sequence electric loading scheme to obtain an enhanced electric loading scheme; applying an enhanced electric loading scheme to the target sample cable to obtain a wide-frequency-domain transient signal in an insulation critical failure stage in the target sample cable; performing correlation path backtracking on the wide-frequency-domain transient signal and the dielectric parameter change track to obtain a causal correlation map of insulation failure in the target sample cable; according to the invention, the efficiency of an experiment for simulating cable insulation breakdown under ocean dynamics can be improved.

The application discloses a kind of cable insulation life index determination methods, comprising the following steps: step one: selecting the starting voltage and interstage voltage increasing rate of step-by-step breakdown test, two groups of cable insulation samples are selected to carry out step-by-step breakdown test with different voltage increasing time in each stage according to certain voltage increasing ratio;Step two: applying calculus and inverse power law to describe interstage voltage increasing electrical aging process, based on inverse power law and electrical aging cumulative effect, a nonlinear life equation is established according to the step-by-step breakdown test data of each sample;Step three: considering the randomness of step-by-step breakdown test, the electrical aging cumulative amount of a group of samples with the same voltage increasing time in each stage is averaged, the life equations of samples in the same group are combined into one equation, and after the life equations of two groups of samples are combined respectively, an equation set is obtained;Step four: solve the nonlinear life equation set in step three by using matlab software, and obtain the life index of cable insulation sample.

The utility model relates to the technical field of charging aging, in particular to a multi-channel program-controlled fast charging aging test circuit and electronic equipment. Comprising a main control module, a fast charging module, a parameter acquisition module, a power supply module and a communication module, the first end of the power supply module is connected with the first end of the fast charging module; the first end of the main control module is connected with the second end of the fast charging module, and the third end of the fast charging module is connected with an external output interface; the output interface is connected with the first end of the parameter acquisition module, and the second end of the parameter acquisition module is connected with the fourth end of the fast charging module; the second end of the master control module is connected with the first end of the communication module, and the second end of the communication module is connected with an external upper computer. According to the invention, the flexibility, the data acquisition capability and the economic benefit of the fast charge aging method can be improved, and a more intelligent aging test solution is provided.

The present invention discloses a method for evaluating the thermal stability of a doped region of a semiconductor device, comprising: Step 1, providing a chip sample on which the fabrication of a first doped region that needs to be analyzed for thermal stability is completed. Step 2, forming a first protective layer by an electron beam assisted deposition process, and setting the material of the first protective layer and the electron beam energy parameters of the electron beam assisted deposition process to ensure that electrons can enter the surface of the semiconductor substrate and generate a thermal effect on the first doped region to form a first defect. Step 3, using FIB to perform ion beam milling to form a TEM sample. Step 4, analyzing the TEM results of the TEM sample to obtain the morphology of the first defect and evaluating it. The present invention does not need to evaluate the thermal stability of the doped region through electrical aging tests, but can directly evaluate the thermal stability of the doped region by observing the defects formed by thermal damage in the doped region.

The utility model discloses a multipath cascade coil assembly power-on aging intelligent detection device, which relates to the technical field of hydraulic servo valve detection, adopts a cascade expansion mode, and can meet the requirement of the actual production coil aging number according to the number of field actual aging coil loads and the number of cascade splicing coil aging test boards. Through matched testing software, the actual current magnitude and the aging time duration of a coil assembly needing to be aged are independently set, the actual coil current value and the coil resistance value in the aging process are monitored in real time, the abnormal coil assembly is subjected to color distinguishing alarm management, and the fault time and state are recorded; and the actual production process requirements of the field coil assembly can be well met, and the convenience and operability are greatly improved.

The invention belongs to the technical field of dimming film aging test, and particularly relates to a dimming film-based power-on aging detection vehicle, which comprises an aging vehicle body, a plurality of pairs of parallel sliding rails are arranged on the inner side wall of the aging vehicle body, two slidable sliding seats are symmetrically mounted on each pair of sliding rails, a bearing vehicle body is fixedly connected between the two sliding seats, and a plurality of test plates are detachably mounted on the inner side of the bearing vehicle body; a plurality of supporting columns are arranged on each testing plate, a plurality of fixing seats are arranged around the supporting columns, sliding grooves are formed in the tops of the fixing seats, sliding blocks capable of sliding are assembled in the sliding grooves, sliding frames are connected to the tops of the sliding blocks, and the sliding frames and the fixing seats are driven by first electric push rods to move relatively; according to the invention, accurate and automatic positioning and correction are realized, the clamping mechanism is driven by the step-by-step and direction-by-direction electric push rod, clamping and fixing of the dimming film can be automatically completed, and automatic correction and positioning of the dimming film on a test station are realized at the same time.