17 results about "Micro raman" patented technology

The invention discloses an ultrasonic phased array driven graphene oxide flow stripping and closed-loop regulation and control system and method, and the system comprises an ultrasonic phased array module, and a piezoelectric transducer array element in the ultrasonic phased array module controls sound beam focusing and energy distribution through a phase delay controller, and carries out the stripping of graphite oxide flowing in a flow channel; a micro-Raman spectrometer in the micro-fluidic-Raman detection module collects characteristic peak data of a graphene oxide sheet layer in a micro-fluidic chip in real time and sends the characteristic peak data to a signal analysis unit; and the feedback control module is used for receiving the layer number distribution data output by the signal analysis unit, dynamically adjusting ultrasonic parameters of the phase delay controller, and controlling the diverter valve to guide substandard products into a secondary treatment channel and finally return the substandard products to the flow channel for stripping again. The system and the method for stripping the graphene oxide based on coupling of the ultrasonic phased array and the micro-fluidic chip have the advantages of efficient stripping, accurate detection, closed-loop optimization and the like.

The invention discloses a multi-mode microscopic Raman spectrum detection system, which comprises a white light microscopic imaging module, a reflection type Raman spectrum excitation and detection module, a transmission type Raman spectrum excitation and detection module, an optical information excitation module and an optical guiding module. Light path integration of all the modules is realized by sharing a microscope objective, image acquisition, reflection Raman detection and transmission Raman detection of a sample can be completed on the same platform, and the device has the advantages of high spatial alignment, flexible operation switching and adaptability to detection of multiple types of samples, and is suitable for micro-area Raman analysis in the fields of biomedicine, material science and the like.

The utility model provides a shading device for a confocal microscopic Raman spectrometer, and relates to the confocal microscopic Raman spectrometer, the shading device comprises a semi-enclosed cassette, the bottom surface of the semi-enclosed cassette is an opening, the bottom ends of the left and right side walls of the semi-enclosed cassette are both provided with connecting slide rails capable of being connected with an external sample placing table, and the connecting slide rails are provided with connecting holes. The connecting sliding rails are connected with the limiting sliding grooves in an inserted mode, an observation window is formed in the top face of the half-surrounding cassette, and a detachable rear cover plate is arranged on the back face of the half-surrounding cassette. When in use, the semi-surrounded cassette is arranged to cover the sample placing table to cover and shade the transparent solution, and the observation window is formed in the top of the semi-surrounded cassette for laser to enter the transparent solution to excite particles in the solution and for an optical lens of a microscope to observe the transparent solution, so that the effects of reducing the influence of ambient light on the transparent solution are achieved; and the irradiation of laser and the observation of a microscope are not hindered.

To provide a pressure / strain device capable of performing pressurization in one direction, and automatically measuring physical property evaluation of a sample from the one direction and a direction perpendicular to the one direction, an X-ray diffraction device using the pressure / strain device, a microscopic Raman scattering measurement device and an optical microscope.SOLUTION: A pressure / strain device of the present invention comprises first and second diamond anvils for holding a sample. The pressure / strain device comprises: a sample holding part in which the first diamond anvil rotates; a rotation mechanism that rotates the first diamond anvil; a pressing mechanism that mechanically applies pressure from the first diamond anvil side; an actuator that applies pressure by an electric signal to the second diamond anvil, and is hollow; a pressure sensor that detects a pressure applied to the sample held between the first and second diamond anvils; and a control mechanism that controls, and detects these operations.SELECTED DRAWING: Figure 1

The application provides a micro-fluidic burner for microscopic optical diagnosis experiment, and belongs to the technical field of online combustion diagnosis. The burner comprises a mounting assembly for fixing the micro-fluidic burner, a cavity assembly for connecting with an experimental gas path, a nozzle connected with the gas path in the cavity assembly for realizing ignition combustion, a nozzle fixing assembly for fixing the nozzle on the cavity assembly, and a light window for transmitting laser and weak scattering signals of optical diagnosis to observe combustion. The cavity assembly comprises a sealingly connected upper cavity and lower cavity. The micro-fluidic burner can ignite methane, acetylene, ethylene and other gas flames, has the characteristics of small volume and replaceable nozzle, realizes positioning and fitting of the combustion nozzle by adopting a conical surface structure, can replace combustion nozzles with different structures according to actual research needs, can be used for microscopic diagnosis in the optical aspect, and can be particularly applied to in-situ microscopic Raman spectrum diagnosis of combustion carbon deposition.

The invention provides a preparation method of a high-performance SERS (Surface Enhanced Raman Scattering) substrate based on colloidal crystal template etching and application of the high-performance SERS substrate in detection of benzylpenicillin potassium in medical wastewater. The specific preparation process comprises the following steps: S1, obtaining large-area polystyrene colloid nanospheres which are uniformly, tightly and hexagonally arranged on the water surface by using an inclined plate-assisted gas-liquid interface self-assembly method, and transferring a crystal mask plate to the surface of a clean silicon substrate at a constant speed by using a Czochralski method; s2, putting the silicon wafer integrated with the large-area nanospheres into reactive ion etching (Oxford 100), uniformly etching the nanospheres by adopting oxygen plasma, shortening the distance between the nanospheres, and enhancing local electromagnetic coupling; s3, silver of 60 nm is deposited on the surfaces of the nanospheres in a thermal evaporation mode, and due to the electromagnetic resonance effect of the metal nanoparticles, Raman signals can be further enhanced. And S4, putting the structured SERS substrate and the untreated substrate into a penicillin potassium solution with the concentration of 0.1 mol / L, soaking for 20 minutes, naturally airing, and measuring a Raman signal by using a micro Raman spectrometer.

This invention provides active materials, electrodes, secondary batteries, battery packs, and vehicles for secondary batteries that achieve excellent fast charge / discharge performance and cycle life. It provides an active material comprising a composite oxide having a crystal structure comprising a rhenium oxide-type bulk structure containing an octahedral structure composed of oxygen and metal elements, and formed by the common vertices of the octahedral structure. The composite oxide is in the form of the general formula Li. a M b NbMo c O d M is selected from any one or more of Ti, V, Ta, Fe, Co, Mn, Ni, Bi, Sb, As, P, Cr, W, B, Na, K, Mg, Al, Ca, Y, and Si, where 0 ≤ a ≤ b + 2 + 3c, 0 ≤ b ≤ 1.5, 0 ≤ c ≤ 0.5, and 2.33 ≤ d / (1 + b + c) ≤ 2.50. In the micro Raman spectrophotometer of the composite oxide at an excitation wavelength of 532 nm, the value is located at 640 ± 10 cm⁻¹. ‑1 The displacement S1 of the Raman peak P1 originating from the Mo-O bond is located at 920±20cm. ‑1 The difference in displacement S2 of the Raman peak P2 originating from the Nb-O bond is 285 cm. ‑1 above.

A microscopic Raman spectroscopy device includes laser oscillators (excitation light sources) that emit excitation laser lights (excitation lights) of different wavelengths, a spectrometer that uses a diffraction grating to disperse Raman scattering light emitted from a sample by irradiation with the excitation laser light from the laser oscillator, and a CCD detector that detects and photoelectrically converts the Raman scattering light dispersed by the spectrometer. The spectrometer includes incident apertures, a plurality of (two) optical systems that guide the Raman scattering light incident from the incident aperture to the diffraction grating, and a plurality of light beams dispersed by the diffraction grating are incident on one imaging lens in tandem.

Microscopic Raman spectroscopy device that detects and analyzes Raman scattering light emitted from sample irradiated with excitation light includes: laser light source that emits excitation light; spectrometer for measuring spectrum of the Raman scattering light; wavelength discriminator such as a dichroic filter that reflects the excitation light emitted from the laser light source toward the sample and transmits Raman scattering light emitted from the sample toward the spectrometer; condenser lens arranged between wavelength discriminator and the spectrometer for condensing the Raman scattering light passing through the wavelength discriminator; aperture arranged between the condenser lens and the spectrometer for limiting Raman scattering light incident on the spectrometer; adjusting means for adjusting to match a position of spot image of Raman scattering light condensed by condensing lens with a position of the aperture so that light amount of Raman scattering light passing through the aperture is maximized.

The invention discloses a method and a system for measuring three-dimensional sphericity and components of micro-plastic particles. The method comprises the following steps: scanning a filter membrane by utilizing microscopic Raman or confocal Raman, screening and positioning suspected micro-plastic particles based on Raman fingerprint peaks, and determining polymer components; then, on the same filter membrane or slide glass, transferring the sample to a scanning electron microscope equipped with a variable inclination angle sample table, performing high-resolution imaging on the same particle at a plurality of inclination angles to obtain a single particle three-dimensional shape model, and calculating parameters such as volume, surface area and sphericity; one-to-one correspondence of Raman data and SEM data is realized through registration of grid coordinates and feature points of the filter membrane, and a single-particle database of spatial position-polymer type-three-dimensional morphology-sphericity is established. According to the method, a pretreatment process of enzyme digestion, mild oxidation and density separation is designed, micro-plastic particles are enriched on a filter membrane or a slide glass which is provided with a two-dimensional coordinate mark, can be used for Raman detection and is provided with a conductive coating on the surface, and the detection precision is improved.

The present application belongs to the technical field of diamond coating tool performance detection, and particularly relates to a diamond coating interface performance evaluation method based on cross-section microscopic Raman. The method comprises: obtaining a sample containing a flat cross-section of diamond coating; performing Raman area scanning on spatial measurement points containing film-base interfaces on the flat cross-section of the sample, extracting characteristic peak parameters and calculating diamond content parameters and interface residual stress; performing indentation test in the region containing the film-base interface to obtain measured indentation hardness and / or measured indentation modulus; taking the Raman characteristic parameters and the characteristic peak parameters as inputs and the indentation mechanical properties as outputs to construct a quantitative correlation prediction model; and substituting the parameters of the sample to be tested to obtain the mechanical property prediction value. The present application realizes accurate spatial registration and quantitative prediction of the same micro-area phase structure, stress and mechanical property, solves the problems of difficult interface detection of special-shaped tools and lack of quantitative correlation model of microstructure and mechanical property.

The present application belongs to the technical field of optical detection equipment, and particularly relates to a microscopic Raman detection equipment, which comprises a main body component, a top cover component and a bottom cover component; a control adjusting component is arranged in the main body component; an optical component is arranged in the main body component, and the optical component comprises an optical slit, an optical support, a beam splitter support, a visible light near-infrared beam splitter, a double-glued mirror, an illumination assembly and a data transmission assembly; the visible light near-infrared beam splitter is installed on the beam splitter support; the optical slit, the beam splitter support, the double-glued mirror, the illumination assembly and the data transmission assembly are all installed on the optical support; the illumination assembly and the data transmission assembly are electrically connected with the main control board; laser reflected by the visible light near-infrared beam splitter passes through the optical support channel, reaches the double-glued mirror, and is converged on a sample by the double-glued mirror; and an imaging component is arranged.

The invention provides a microscopic Raman imaging super-resolution detection method, device and equipment and a medium, and the method comprises the steps: collecting low-resolution Raman images and high-resolution images of a plurality of samples, and constructing a data set; inputting a low-resolution Raman image in a sample into the constructed diffusion adversarial network, and outputting a super-resolution Raman image; carrying out similarity calculation on the super-resolution Raman image and the high-resolution Raman image; when the similarity is smaller than a preset similarity threshold value, the training process is continued, and training is ended until the similarity is larger than the preset similarity threshold value; and collecting a low-resolution Raman image of a to-be-detected sample, inputting the low-resolution Raman image of the to-be-detected sample into the trained diffusion adversarial network, outputting a super-resolution Raman image of the to-be-detected sample, and detecting the quality of the to-be-detected sample based on the super-resolution Raman image of the to-be-detected sample. The problem of low efficiency in the traditional grain grade detection process can be solved.

The invention discloses a shape parameter measuring device for a wafer-level carbon-based semiconductor epitaxial layer, and the device comprises a vertical sample stage module which is used for clamping a wafer sample and enabling the wafer sample to be perpendicular to the upper surface of a rack; the combined light source type ellipsometry module and the confocal microscopic Raman spectrum measurement module are respectively used for detecting ellipsometry spectrum information and Raman spectrum information of the same point position on a carbon-based semiconductor epitaxial layer on the surface of the wafer sample; the combined light source type ellipsometry module and the confocal microscopic Raman spectrum measurement module are respectively connected with the data processing module, the physical characteristics of the carbon-based semiconductor epitaxial layer are extracted according to Raman spectrum information and ellipsometry spectrum information, and an optical model and an oscillator model are established according to the physical characteristics of the carbon-based semiconductor epitaxial layer. By means of the method, the problem that it is difficult to carry out high-precision in-situ characterization on the shape parameters of the large-size wafer is solved.

The utility model provides a temperature control assembly used for a confocal microscopic Raman spectrometer, and relates to the confocal microscopic Raman spectrometer technology field, the temperature control assembly comprises a slide placing table and a circulating device, the slide placing table is internally provided with a water storage cavity, the water storage cavity is internally provided with a heating device, and the heating device is internally provided with a temperature control device. The heating device heats the liquid in the water storage cavity, the temperature of the liquid is conducted to the outer surface of the slide placing table, the circulating device is communicated with the water storage cavity, and the circulating device drives the liquid in the water storage cavity to circulate. During use, the water storage cavity is formed in the slide placement table, liquid is injected into the water storage cavity, the liquid is heated through the heating device arranged in the water storage cavity, and the liquid is circulated through the circulating device, so that the temperature is kept relatively constant, and heat of the liquid is conducted to a material on a slide through the slide placement table; the effects of enabling the temperatures of the sample materials to be similar and improving the accuracy of observation data are achieved.