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Method for detecting and analyzing vehicular window switch failure

A technology of window switch and analysis method, which is applied in the fields of analyzing materials, conducting material analysis by optical means, and conducting material analysis by using wave/particle radiation, etc. Authenticity and reliability, reduced analysis errors, simple and clear steps

Inactive Publication Date: 2013-01-02
SHANGHAI FALAB TEST
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to solve the problem that the cause of electronic product failure cannot be analyzed in detail and completely, the present invention provides the following technical solutions:

Method used

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  • Method for detecting and analyzing vehicular window switch failure
  • Method for detecting and analyzing vehicular window switch failure

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Embodiment Construction

[0019] The process embodiment will be described in detail below, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0020] The switch samples of this embodiment include good products and defective products. After dismantling the switch sample, it was found that the switch has four electrodes, and there are four conductive copper sheets in the corresponding white rubber cap. Car window switch up and down. like figure 1 As shown in the flow chart of the present invention, first, the appearance inspection is carried out on two kinds of switch samples. By comparing the surface of the defective product with the surface of the good product, it is found that some electrodes on the defective product are seriously polluted, and it is found that there are white and black on the electrodes on both sides and the surrounding area. Powder remai...

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Abstract

The invention belongs to the analysis field of faults of electronic products and provides a method for detecting and analyzing a vehicular window switch failure. The method includes the steps of A, performing failure positioning for a failed vehicular window switch sample, finding out failure position via appearance inspection and electrical test; B, finding out failure reasons; C, analyzing and troubleshooting the failures reason: determining the specific reason for the failure of a vehicular window by sequentially verifying possible reasons obtained in the step B; D, simulating and reappearing failure phenomenon and verifying a failure mechanism. The method is simple and clear in steps and can find out various reasons for failures of electronic products. By utilizing the method of 'method of exhaustion', failure reasons as many as possible for the electronic products can be found out, and by simulating and reappearing failure phenomenon, authenticity and reliability of the failure reason are improved, and errors in analysis are greatly reduced.

Description

technical field [0001] The invention relates to the field of analysis of electronic products, in particular to a failure analysis method of an electronic switch. Background technique [0002] With the rapid development of modern science and technology, electronic products have filled every field of human production and life. For example, mobile phones, electric vehicles, TVs, computers in daily life, equipment controllers, drivers, equipment remote controls, etc. in production, all involve electronic products or electronic devices, so the quality of electronic products has a great impact on human life and production. important influence. In the current human activities, when some electronic products have problems, the problem is usually solved by replacing the module, but the cause of the problem can only be calculated and analyzed simply, and there is no systematic method to analyze it, resulting in the current It is difficult to further improve the quality of electronic ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327G01N21/00G01N21/35G01N23/00G01N21/3563
Inventor 李红高
Owner SHANGHAI FALAB TEST
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