Capacitor failure analysis method

A technology of failure analysis and capacitance, which is applied in the direction of material analysis using measurement of secondary emissions, which can solve the problems of small capacitance value and shedding of capacitor metallization layer, and achieve the effect of accurate analysis and simple and clear steps.

Inactive Publication Date: 2012-04-18
SHANGHAI FALAB TEST
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Problems solved by technology

[0006] In order to solve the problem that the common capacitor failure analysis method is likely to cause misjudgment that the metallization layer of the capacitor itself falls off and the capacitance value is too small, the present invention proposes the following technical solutions:

Method used

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Embodiment Construction

[0015] The preferred embodiments of the present invention are described in detail below, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0016] A failure analysis method for a capacitor, comprising the following steps:

[0017] A. Observe the appearance of the capacitor samples that need to be analyzed, and analyze the possible practical reasons;

[0018] B. Carry out X-Ray perspective inspection on the capacitor samples that need to be analyzed to confirm the internal structure of the capacitor;

[0019] C. Use a knife to cut the capacitor and take out the film in the capacitor sample;

[0020] D. Make the capacitance sample that needs to be analyzed into a metallographic slice sample;

[0021] E. Use a scanning electron microscope to observe and analyze the metallographically sliced ​​samples;

[0022] F. Comprehensively ana...

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Abstract

The invention provides a capacitor failure analysis method. The method comprises the following steps: A, observing appearance of a capacitor sample needing to be analyzed, analyzing a possible failure reason; B, X-Raying the capacitor sample needing to be analyzed to confirm the internal structure of the capacitor; C, cutting the capacitor open by a knife, taking a film out of the capacitor sample; D, manufacturing the capacitor sample needing to be analyzed into a micro-sectioned sample; E, using a scanning electron microscope to observe and analyze the micro-sectioned sample; and F, comprehensively analyzing the results obtained from the above steps to determine the reason of capacitor failure. The method has the advantage of simple and clear steps, can accurately analyze the reason of capacitor failure and can avoid erroneous judgment.

Description

technical field [0001] The invention relates to a failure analysis method of a capacitor, in particular to a failure analysis method for avoiding misjudgment of the cause of a small capacitance value. Background technique [0002] The capacitance value of the capacitor is lower than normal, and the failure analysis is carried out on it. General failure analysis methods will carry out X-ray perspective inspection, metallographic slice analysis, unsealing, internal inspection and energy spectrum analysis. Generally, there are two methods of dissecting capacitors: [0003] Removal of resin and other molded housings: Leads can be cut off first, then the edges of the molding material can be ground away until the mica edge is exposed. The rest of the molding material can be slowly pried off. When the breakdown of the shell is related to a certain resin and curing degree to a certain extent, put the shell capacitor in 16% sodium hydroxide solution, heat it to 60°C for 5h (small ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/22
Inventor 吴春晖
Owner SHANGHAI FALAB TEST
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